RECHERCHER
Résultats de la recherche ""
Si 1s−1, 2s−1 and 2p−1 lifetime broadening of SiX4 (X = F, Cl, Br, CH3) molecules: SiF4 anomalous behaviour reassessed
Publié le 13/04/2019
... Püttner, R., Marchenko, T., Guillemin, R., Journel, L., Goldsztejn, G., Céolin, D., Takahashi, O., Ueda, K., Lago, A.F., Piancastelli, M.N., Simon, M. "Si 1s−1, 2s−1 and 2p−1 lifetime broadening of SiX4 (X = F, Cl, Br, CH3) molecules: SiF4 anomalous ...
CALIPSO plus : SOLEIL et Synchrotronix travaillent ensemble pour améliorer les techniques d'analyse de surface pour l'Industrie
Publié le 04/04/2019
... De nombreux acteurs privés sont aujourd'hui confrontés à des difficultés lorsqu’ils doivent caractériser finement la surface des matériaux. Le développement de techniques pratiques et fiables devrait cependant changer ...
Recoil-induced ultrafast molecular rotation probed by dynamical rotational Doppler effect
Publié le 20/02/2019
... Céolin, D., Liu, J.C., Vaz da Cruz, V., Ågren, H., Journel, L., Guillemin, R., Marchenko, T., Kushawaha, R.K., Piancastelli, M.N., Püttner, R., Simon, M., Gel’mukhanov, F. "Recoil-induced ultrafast molecular rotation probed by dynamical rotational Doppler ...
Oxygen states in La- and Rh-doped Sr2IrO4 probed by angle-resolved photoemission and O K-edge resonant inelastic x-ray scattering
Publié le 20/02/2019
... Ilakovac, V., Louat, A., Nicolaou, A., Rueff, J.P., Joly, Y., Brouet, V. "Oxygen states in La- and Rh-doped Sr2IrO4 probed by angle-resolved photoemission and O K-edge resonant inelastic x-ray scattering" Physical Review B., 99(3): art.n° 035149. (2019). ...
Defect State Analysis in Ion‐Irradiated Amorphous‐Silicon Heterojunctions by HAXPES
Publié le 20/02/2019
... Lee, M.I., Defresne, A., Plantevin, O., Céolin, D., Roca i Cabarrocas, P., Tejeda, A. "Defect State Analysis in Ion‐Irradiated Amorphous‐Silicon Heterojunctions by HAXPES" Physica Status Solidi - Rapid Research Letters., 13(5): art.n° 1800655. (2019). ...
Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering
Publié le 19/01/2019
... Desjardins, K., Popescu, H., Mercère, P., Menneglier, C., Gaudemer, R., Thånell, K., Jaouen, N. "Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering" AIP Conference Proceedings., 2054: art.n° 060066. (2019). ...
Vanadium Doping Enhanced Electrochemical Performance of Molybdenum Oxide in Lithium‐Ion Batteries
Publié le 10/01/2019
... Qu, G., Wang, J., Liu, G., Tian, B., Su, C., Chen, Z., Rueff, J.P., Wang, Z. "Vanadium Doping Enhanced Electrochemical Performance of Molybdenum Oxide in Lithium‐Ion Batteries" Advanced Functional Materials., 29(2): art.n° 1805227. (2019). ...
Structural Study of Cu(II):Glycine Solution by X-ray Absorption Spectroscopy
Publié le 20/12/2018
... Klaiphet, K., Saisopa, T., Pokapanich, W., Tangsukworakhun, S., Songsiriritthigul, C., Saiyasombat, C., Céolin, D., Songsiriritthigul, P. "Structural Study of Cu(II):Glycine Solution by X-ray Absorption Spectroscopy" Journal of Physics Conferences Series. ...
Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories
Publié le 20/12/2018
... Kazar Mendes, M., Martinez, E., Ablett, J.M., Veillerot, M., Gassilloud, R., Bernard, M., Renault, O., Rueff, J.P., Barrett, N. "Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories" Scientific Reports., 8: art.n° 17919. (2018). ...
Local environment of arsenic in sulfide minerals: insights from high-resolution X-ray spectroscopies, and first-principles calculations at the As K-edge
Publié le 12/12/2018
... Le Pape, P., Blanchard, M., Juhin, A., Rueff, J.P., Ducher, M., Morin, G., Cabaret, D. "Local environment of arsenic in sulfide minerals: insights from high-resolution X-ray spectroscopies, and first-principles calculations at the As K-edge" Journal of ...