RECHERCHER
Résultats de la recherche ""
Evaluation of new non-toxic corrosion inhibitors for conservation of iron artefacts
Publié le 10/11/2016
... Hollner, S., Mirambet, F., Rocca, E., Reguer, S. "Evaluation of new non-toxic corrosion inhibitors for conservation of iron artefacts" Corrosion Engineering Science and Technology., 45(5): 362-366. (2010). ...
A Miniature Maxthal Furnace for X-ray Spectroscopy and Scattering Experiments up to 1200 degrees C
Publié le 10/11/2016
... Gorges, B., Vitoux, H., Redondo, P., Carbone, G., Mocuta, C., Guilera, G. "A Miniature Maxthal Furnace for X-ray Spectroscopy and Scattering Experiments up to 1200 degrees C" Paper presented at the SRI 2009, 10th International Conference on Synchrotron ...
Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response
Publié le 10/11/2016
... Geandier, G., Thiaudiere, D., Randriamazaoro, R.N., Chiron, R., Djaziri, S., Lamongie, B., Diot, Y., Le Bourhis, E., Renault, P.O., Goudeau, P., Bouaffad, A., Castelnau, O., Faurie, D., Hild, F. "Development of a synchrotron biaxial tensile device for in ...
Elastic-strain distribution in metallic film-polymer substrate composites
Publié le 10/11/2016
... Geandier, G., Renault, P.O., Le Bourhis, E., Goudeau, P., Faurie, D., Le Bourlot, C., Djémia, P., Castelnau,O., Chérif, M. "Elastic-strain distribution in metallic film-polymer substrate composites" Applied Physics Letters., 96(4): art.n° 041905. (2010). ...
X-ray strain analysis in thin films enhanced by 2D detection
Publié le 10/11/2016
... Geandier, G., Faurie, D., Renault, P.O., Le Bourlot, C., Djémia, P., Castelnau, O., Chérif, S.M., Le Bourhis, E., Goudeau, P. "X-ray strain analysis in thin films enhanced by 2D detection" EPJ Web of Conferences., 6: art.n° 26008. (2010). ...
Mechanical characterization of nanostructured thin films at different scales
Publié le 10/11/2016
... Djaziri, S., Thiaudière, D., Geandier, G., Renault, P.O., Le Bourhis, E., Goudeau, P., Randriamazaoro, R., Chiron, R., Castelnau, O., Faurie, D., Hild, F. "Mechanical characterization of nanostructured thin films at different scales" EPJ Web of ...
Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction
Publié le 10/11/2016
... Djaziri, S., Thiaudiere, D., Geandier, G., Renault, O., Le Bourhis, E., Goudeau, P., Castelnau, O., Faurie, D. "Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction" Surface and Coatings Technology., 205(5): 1420 ...
Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
Publié le 10/11/2016
... Diaz, A., Mocuta, C., Strangl, J., Keplinger, M., Weitkamp, T., Pfeiffer, F., David, C., Metzger, T.H., Bauer, G. "Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry" Journal of Synchrotron Radiation., 17 ...
Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study
Publié le 10/11/2016
... Diaz, A., Chamard, V., Mocuta, C., Magalhães-Paniago, R., Stangl, J., Carbone, D., Metzger, T.H., Bauer, G. "Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study" New Journal of Physics., 12(3): art ...
Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case
Publié le 10/11/2016
... Chamard, V., Strangl, J., Carbone, D., Diaz, A., Chen, J., Alfonso, C., Mocuta, C., Metzger, T.H "Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case" Physical Review Letters., 104(16): art.n° 165501. (2010). ...