RECHERCHER

... Lablanquie, P., Penent, F., Palaudoux, J., Andric, L., Selles, P., Carniato, S., Bucar, K., Žitnik, M., Huttula, M., Eland, J.H.D., Shigemasa, E., Soejima, K., HikoSaka, Y., Suzuki, I. H., Nakano, H., Ito, K. "Single-Photon Core Double Ionization in ...

... Korsunsky, A.M., Hofmann, F., Abbey, B., Song, X., Belnoue, J.P., Mocuta, C., Dolbnya, I. "Analysis of the internal structure and lattice (mis)orientation in individual grains of deformed nickel polycrystals by synchrotron X-ray micro-diffraction and ...

... Khaliq, A., Pierucci, D., Tissot, H., Gallet, J.J., Bournel, F., Rochet, F., Silly, M.G., Sirotti, F. "Ene-Like Reaction of Cyclopentene on Si(001)–2×1: an XPS and NEXAFS Study" Journal of Physical Chemistry C., 116(23): 12680–12686. (2012). ...

... Izquierdo, M., Hardion, V., Renaud, G., Chapuis, L., Millet, L., Langlois, F., Marteau, F., Chauvet, C. "SUMS: synchronous undulator-monochromator scans at Synchrotron Soleil" Journal of Synchrotron Radiation., 19(4): 619-626. (2012). ...

... Itié, J.P., Baudelet, F., Briois, V., Elkaim, E., Nadji, A., Thiaudiere, D., Philippe Goudeau, René Guinebretière "Synchrotron Radiation: Instrumentation in Condensed Matter" In X-Rays and Materials: 1-47: Wiley, 2012. ISBN: 9781848213425 ...

... Hild, F., Roux, S. "Comparison of Local and Global Approaches to Digital Image Correlation" Experimental Mechanics., 52(9): 1503-1519. (2012). ...

... Guzzo, M., Kas, J.J., Sottile, F., Silly, M.G., Sirotti, F., Rehret, J.J., Reining, L. "Plasmon satellites in valence-band photoemission spectroscopy Ab initio study of the photon-energy dependence in semiconductors" European Physical Journal B., 85(9): ...

... Gobaut, B., Penuelas, J., Grenet, G., Ferrah, D., Benamrouche, A., Chettaoui, A., Robach, Y., Botella, C., El Kazzi, M., Silly, M.G., Sirotti, F., Saint -Girons, G. "Ge/SrTiO3(001): Correlation between interface chemistry and crystallographic orientation" ...

... Fouet, J., Richard, M.I., Mocuta, C., Guichet, C., Thomas, O. "In situ combined synchrotron X-ray diffraction and wafer curvature measurements during formation of thin palladium silicide film on Si(001) and Si (111)" Nuclear Instruments and Methods B., ...

... Faurie, D., Renault, P.O., Geandier, G., Le Bourhis, E. "Time resolved synchrotron x-ray strain measurements of gold thin film on flexible substrate" Thin Solid Films., 520(5): 1603-1607. (2012). ...