RECHERCHER

... Gorges, B., Vitoux, H., Redondo, P., Carbone, G., Mocuta, C., Guilera, G. "A Miniature Maxthal Furnace for X-ray Spectroscopy and Scattering Experiments up to 1200 degrees C" Paper presented at the SRI 2009, 10th International Conference on Synchrotron ...

... Geandier, G., Thiaudiere, D., Randriamazaoro, R.N., Chiron, R., Djaziri, S., Lamongie, B., Diot, Y., Le Bourhis, E., Renault, P.O., Goudeau, P., Bouaffad, A., Castelnau, O., Faurie, D., Hild, F. "Development of a synchrotron biaxial tensile device for in ...

... Geandier, G., Renault, P.O., Le Bourhis, E., Goudeau, P., Faurie, D., Le Bourlot, C., Djémia, P., Castelnau,O., Chérif, M. "Elastic-strain distribution in metallic film-polymer substrate composites" Applied Physics Letters., 96(4): art.n° 041905. (2010). ...

... Geandier, G., Faurie, D., Renault, P.O., Le Bourlot, C., Djémia, P., Castelnau, O., Chérif, S.M., Le Bourhis, E., Goudeau, P. "X-ray strain analysis in thin films enhanced by 2D detection" EPJ Web of Conferences., 6: art.n° 26008. (2010). ...

... Ellis, G., Santoro, G., Gomez, M.A., Marco, C. "Synchrotron IR microspectroscopy: Opportunities in polymer science" IOP Conf. Series: Materials Science and Engineering., 14: art.n° 012019. (2010). ...

... Echard, J.P., Bertrand, L., von Bohle, A., Le Hô, A.S., Paris, C., Bellot-Gurlet, L., Soulier, B., Lattuati-Derieux, A., Thao, S., Robinet, L., Lavédrin, B., Vaiedelich, S. "The Nature of the Extraordinary Finish of Stradivarir's Instruments" Angewandte ...

... Echard, J.P., Bertrand, L. "Complementary spectroscopic analyses of varnishes of historical musical instruments" Spectroscopy Europe., 22(2): 12-15. (2010). ...

... Djaziri, S., Thiaudière, D., Geandier, G., Renault, P.O., Le Bourhis, E., Goudeau, P., Randriamazaoro, R., Chiron, R., Castelnau, O., Faurie, D., Hild, F. "Mechanical characterization of nanostructured thin films at different scales" EPJ Web of ...

... Djaziri, S., Thiaudiere, D., Geandier, G., Renault, O., Le Bourhis, E., Goudeau, P., Castelnau, O., Faurie, D. "Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction" Surface and Coatings Technology., 205(5): 1420 ...

... Diaz, A., Mocuta, C., Strangl, J., Keplinger, M., Weitkamp, T., Pfeiffer, F., David, C., Metzger, T.H., Bauer, G. "Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry" Journal of Synchrotron Radiation., 17 ...