RECHERCHER

... Neuville, D.R., Hennet, L., Florian, P., de Ligny, D. "In situ High-Temperature Experiments" Reviews in Mineralogy and Geochemistry., 78(1): 779-800. (2014). ...

... Neggache, A., Hauet, T., Bertran, F., Le Fevre, P., Petit-Watelot, S., Devolder, T., Ohresser, P., Boulet, P., Mewes, C., Maat, S., Childress, J.R., Andrieu, S. "Testing epitaxial Co1.5Fe1.5Ge(001) electrodes in MgO-based magnetic tunnel junctions" ...

... Monnier, J., Reguer, S., Foy, E., Testemale, D., Mirambet, F., Saheb, M., Dillmann, P., Guillot, I. "XAS and XRD in situ characterisation of reduction and reoxidation processes of iron corrosion products involved in atmospheric corrosion" Corrosion ...

... Hild, F., Roux, S., Helena Jin, Cesar Sciammarella, Cosme Furlong, Sanichiro Yoshida "On the Resolution of Local and Global DIC Approaches" In Imaging Methods for Novel Materials and Challenging Applications, Volume 3: 221-225: Springer, 2013. ISBN: 978-1 ...

... Hejral, U., Vlad, A., Nolte, P., Stierle, A. "In Situ Oxidation Study of Pt Nanoparticles on MgO(001)" Journal of Physical Chemistry C., 117(39): 19955–19966. (2013). ...

... Guillamet, R., Lagay, N., Mocuta, C., Lagrée, P.Y., Carbone, G., Décobert, J. "Micro-characterization and three dimensional modeling of very large waveguide arrays by selective area growth for photonic integrated circuits" Journal of Crystal Growth., 370: ...

... Gibaud, A., Topic, M., Corbel, G., Briois, V., Thiaudiere, D., Pineda-Vargasb, C.A., Ntsoanee, T. "X-ray scattering and EXAFS studies of Pt1-xVx alloys" Journal of Alloys and Compounds., 562: 95-98. (2013). ...

... Gervais, C., Languille, M.A., Reguer, S., Gillet, M., Vicenzi, E.P., Chagnot, S., Baudelet, F., Bertrand, L. "“Live” Prussian blue fading by time-resolved X-ray absorption spectroscopy" Applied Physics A: Materials Science & Processing., 111(1): 15-22. ...

... Gervais, C., Languille, M.A., Reguer, S., Gillet, M., Pelletier, S., Garnier, C., Vicenzi, E.P., Bertrand, L. "Why Does Prussian Blue Fade? Understanding the Role(s) of the Substrate" Journal of Analytical Atomic Spectrometry., 28(10): 1600-1609. (2013) ...

... Faurie, D., Geandier, G., Renault, P.O., Le Bourhis, E., Thiaudiere, D. "Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure" Thin Solid Films., 530: 25-29. (2013). ...