RECHERCHER
Résultats de la recherche ""
Lattice relaxation in the highly-contrasted Zn1-xBexSe alloy: An extended x-ray absorption fine structure study
Publié le 10/11/2016
... Ganguli, T., Mazher, J., Polian, A., Deb, S.K., Villain, F., Pages, O., Paszkowicz, W., Firszt, F. "Lattice relaxation in the highly-contrasted Zn1-xBexSe alloy: An extended x-ray absorption fine structure study" Journal of Applied Physics., 108(8): art ...
Temperature dependence of the pre-edge structure in the Ti K-edge x-ray absorption spectrum of rutile
Publié le 10/11/2016
... Durmeyer, O., Beaurepaire, E., Kappler, A., Brouder, C., Baudelet, F. "Temperature dependence of the pre-edge structure in the Ti K-edge x-ray absorption spectrum of rutile" Journal of Physics Condensed Matter., 22(12): art.n° 125504. (2010). ...
Mechanical characterization of nanostructured thin films at different scales
Publié le 10/11/2016
... Djaziri, S., Thiaudière, D., Geandier, G., Renault, P.O., Le Bourhis, E., Goudeau, P., Randriamazaoro, R., Chiron, R., Castelnau, O., Faurie, D., Hild, F. "Mechanical characterization of nanostructured thin films at different scales" EPJ Web of ...
Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction
Publié le 10/11/2016
... Djaziri, S., Thiaudiere, D., Geandier, G., Renault, O., Le Bourhis, E., Goudeau, P., Castelnau, O., Faurie, D. "Controlled biaxial deformation of nanostructured W/Cu thin films studied by X-ray diffraction" Surface and Coatings Technology., 205(5): 1420 ...
Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry
Publié le 10/11/2016
... Diaz, A., Mocuta, C., Strangl, J., Keplinger, M., Weitkamp, T., Pfeiffer, F., David, C., Metzger, T.H., Bauer, G. "Coherence and wavefront characterization of Si-111 monochromators using double-grating interferometry" Journal of Synchrotron Radiation., 17 ...
Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study
Publié le 10/11/2016
... Diaz, A., Chamard, V., Mocuta, C., Magalhães-Paniago, R., Stangl, J., Carbone, D., Metzger, T.H., Bauer, G. "Imaging the displacement field within epitaxial nanostructures by coherent diffraction: a feasibility study" New Journal of Physics., 12(3): art ...
Combination of optical and X-ray techniques in the study of amorphous semiconductors under high pressure: an upgrade setup for combined XAS and XRD measurements
Publié le 10/11/2016
... Coppari, F., Di Cicco, A., Principi, E., Trapananti, A., Pinto, N., Polian, A., Chagnot, S., Congeduti, A. "Combination of optical and X-ray techniques in the study of amorphous semiconductors under high pressure: an upgrade setup for combined XAS and XRD ...
Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case
Publié le 10/11/2016
... Chamard, V., Strangl, J., Carbone, D., Diaz, A., Chen, J., Alfonso, C., Mocuta, C., Metzger, T.H "Three-Dimensional X-Ray Fourier Transform Holography: The Bragg Case" Physical Review Letters., 104(16): art.n° 165501. (2010). ...
Strain analysis by inversion of coherent Bragg X-ray diffraction intensity: the illumination problem
Publié le 10/11/2016
... Chamard, V., Dolleacute, M., Baldinozzi, G., Livet, F., de Boissieu, M., Labat, S., Picca, F., Mocuta, C., Donnadieu, P., Metzger, T. H. "Strain analysis by inversion of coherent Bragg X-ray diffraction intensity: the illumination problem" Journal of ...
The pathogenesis of Randall's plaque: a papilla cartography of Ca compounds through an ex vivo investigation based on XANES spectroscopy
Publié le 10/11/2016
... Carpentier, X., Bazin, D., Jungers, P., Reguer, S., Thiaudière, D., Daudon, M. "The pathogenesis of Randall's plaque: a papilla cartography of Ca compounds through an ex vivo investigation based on XANES spectroscopy" Journal of Synchrotron Radiation., 17 ...