RECHERCHER

... Borgese, L., Gelfi, M. ., Bontempi, E., Goudeau, P., Geandier, G., Thiaudière, D., Depero, L.E. "Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition" Surface and Coatings Technology., 206(8-9): 2459–2463 ...

... Bertrand, L., Robinet, L., Thoury, M., Janssens, K., Cohen, S.X., Schöder, S. "Cultural heritage and archaeology materials studied by synchrotron spectroscopy and imaging" Applied Physics A: Materials Science & Processing., 106(2): 377-396. (2012). ...

... Bazin, D., Daudon, M., Combes, C., Rey, C. "Characterization and Some Physicochemical Aspects of Pathological Microcalcifications" Chemical Reviews., 112(10): 5092–5120. (2012). ...

... Barbier, A., Mocuta, C., Stanescu, D., Jegou, P., Jedrecy, N., Magnan, H "Surface composition of BaTiO3/SrTiO3(001) films grown by atomic oxygen plasma assisted molecular beam epitaxy" Journal of Applied Physics., 112(11): art.n° 114116. (2012). ...

... Barbier, A., Mocuta, C., Belkhou, R., Bharat Bhushan "Selected Synchrotron Radiation Techniques" In Encyclopedia of Nanotechnology: 2322-2344: Springer, 2012. ISBN: 978-90-481-97507 ...

... Vila-Comamala, J., Diaz, A., Guizar-Sicairos, M., Mantion, A., Kewish, C.M., Menzel, A., Bunk, O., David, C. "Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging" Optics Express., 19(22): 21333-21344 ...

... Vila-Comamala, J., Diaz, A., Guizar-Sicairos, M., Gorelick, S., Guzenko, V.A., Karvinen, P., Kewish, C.M., Färm, E., Ritala, M., Mantion, A., Bunk, O., Menzel, A., David, C., Christian Morawe, Ali M. Khounsary, Shunji Goto "Characterization of a 20-nm ...

... Somogyi, A., Kewish, C.M., Polack, F., Moreno, T., AIP Conference Proceedings "The Scanning Nanoprobe Beamline Nanoscopium at Synchrotron Soleil" Paper presented at the The 10th International Conference on X-ray Microscopy, 15-20/08/2010, Chicago (US). ...

... Saheb, M., Neff, D., Bataillon, C., Foy, E., Dillmann, P. "Copper tracing to determine the micrometric electronic properties of a thick ferrous corrosion layer formed in an anoxic medium" Corrosion science., 53(6): 2201-2207. (2011). ...

... Rouchon, V., Pellizzi, E., Duranton, M., Vanmeert, F., Janssens, K. "Combining XANES, ICP-AES, and SEM/EDS for the study of phytate chelating treatments used on iron gall ink damaged manuscripts" Journal of Analytical Atomic Spectrometry., 26(12): 2434 ...