RECHERCHER
Résultats de la recherche ""
High precision surface metrology using a phase retrieval method
Publié le 10/11/2016
... Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009). ...
Crystalline structure of oxide-based epitaxial tunnel junctions. The effect of optical lithography studied by X-ray microdiffraction
Publié le 10/11/2016
... Mocuta, C., Barbier, A., Ramos, A.V., Guittet, M.J., Moussy, J.B., Stanescu, S., Gatel, G., Mattana, R., Deranlot, C., Petroff, F. "Crystalline structure of oxide-based epitaxial tunnel junctions. The effect of optical lithography studied by X-ray ...
Spatial characterization of SASE-FEL of SCSS Test Accelerator
Publié le 10/11/2016
... Mercère, P., Bachelard, R., Couprie, M. E., Idir, M., Chubar, O., Gautier, J., Lambert, G., Zeitoun, P., Bucourt, S., Dovillaire, G., Levecq, X., Kimura, H., Ohashi, H., Hara, T., Higashiya, A., Ishikawa, T., Nagasono, M., Yabashi, M. "Spatial ...
Perspective for high energy density studies on x-ray FELs
Publié le 10/11/2016
... Lee, R.W., Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Sobierajski, R., Krzywinski, J., Juha, L., Nelson, A.J., Bajt, S., Budil, K., Cauble, R.C., Bornath, T., Burian, T., Chalupsky, J., Chapman, H., Cihelka, J., Döppner, T., ...
Micromechanical Modeling of the Elastic Behavior of Multilayer Thin Films; Comparison with In Situ Data from X-Ray Diffraction
Publié le 10/11/2016
... Geandier, G., Gélebart, F., Castelnau, O., Le Bourhis, E., Renault, P.O., Goudeau, P., Thiaudiere, D. "Micromechanical Modeling of the Elastic Behavior of Multilayer Thin Films; Comparison with In Situ Data from X-Ray Diffraction" In IUTAM Symposium on ...
Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam
Publié le 10/11/2016
... Diaz, A., Mocuta, C., Strangl, J., Mandl, B., David, C., Vila-Comamala, J., Chamard, V., Metzger, T.H., Bauer, G. "Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam" Physical Review B., 79(12): art.n° 125324. ...
Spatially resolved strain within a single SiGe island investigated by X-ray scanning microdiffraction
Publié le 10/11/2016
... Diaz, A., Mocuta, C., Stangl, J., Vila-Comamala, J., David, C., Metzger, T.H., Bauer, G. "Spatially resolved strain within a single SiGe island investigated by X-ray scanning microdiffraction" Physica status Solidi A., 206(8): 1829-1832. (2009). ...
Raman Studies of Corrosion Layers Formed on Archaeological Irons in Various Media
Publié le 10/11/2016
... Bellot-Gurlet, L., Neff, D., Reguer, S., Monnier, J., Saheb, M., Dillmann, P. "Raman Studies of Corrosion Layers Formed on Archaeological Irons in Various Media" Journal of Nano Research., 8: 147-156. (2009). ...
Diffraction techniques and vibrational spectroscopy opportunities to characterise bones
Publié le 10/11/2016
... Bazin, D., Chappard, C., Combes, C., Carpentier, X., Rouzière, S., André, G., Matzen, G., Allix, M., Thiaudière, D., Reguer, S., Jungers, P., Daudon, M. "Diffraction techniques and vibrational spectroscopy opportunities to characterise bones" Osteoporosis ...
Revisiting the localisation of Zn2+ cations sorbed on pathological apatite calcifications made through X-ray absorption spectroscopy
Publié le 10/11/2016
... Bazin, D., Carpentier, X., Brocheriou, I., Dorfmuller, P., Aubert, S., Chappard, C., Thiaudiere, D., Reguer, S., Waychunas, G., Jungers, P., Daudon, M. "Revisiting the localisation of Zn2+ cations sorbed on pathological apatite calcifications made through ...