RECHERCHER

... Mercère, P., Idir, M., Floriot, J., Levecq, X. "Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology" In Modern Developments in X-Ray and Neutron Optics: 219-232: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0 ...

... Idir, M., Mercère, P., Modi, M.H., Dovillaire, G., Levecq, X., Bucourt, S., Escolano, L., Sauvageot, P. "X-ray active mirror coupled with a Hartmann wavefront analyser" Paper presented at the Workshop on X-ray and XUV Active Optics 2nd, 9-11 October 2008. ...

... Guilminot, E., Huet, N., Neff, D., Dillmann, P., Rémazeilles, C., Refait, P., Reguer, S., Bertrand, L., Nicot, F., Mielcarek, F., Rebière, J., Mirambet, F., Janet Bridgland "Dechlorination of archaeological iron artefacts : dechlorination efficiency ...

... Gautier, J., Zeitoun, P., Hauri, C., Morlens, A.S., Rey, G., Valentin, C., Papalarazou, E., Goddet, J.P., Sebban, S., Burgy, F., Mercère, P., Idir, M., Dovillaire, G., Levecq, X., Bucourt, S., Fajardo, M., Merdji, H., Caumes, J.P. "Optimization of the ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Moreno, T., Brochet, S. "A Shack-Hartmann measuring head for the two-dimensional characterization of X-ray mirrors" Journal of Synchrotron Radiation., 15(2): 134-139. ...

... Couprie, M. E., Loulergue, A., Benabderrahmane, C., Chubar, O., Denard, J. C., Filhol, J.M., Idir, M., Labat, M., Lestrade, A., Louvet, M., Marchand, P., Marcouillé, O., Mercère, P., Nadolski, L., Nahon, L., Dumas, P., Morin, P., Bruni, C., Lambert, G., ...

... Bessada, C., Rollet, A.L., Zanghi, D., Melin, P., Labrude, E., Brassamin, S., Pauvert, O., Thefany, C., Matsuura, H., Thiaudière, D., Sitaud, B., Solari, P.L. "A double barrier cell for high temperature EXAFS experiments in molten actinide fluoride ...

... Bazin, D., Carpentier, X., Traxer, O., Thiaudière, D., Somogyi, A., Reguer, S., Waychunas, G., Jungers, P., Daudon, M. "Very first tests on SOLEIL regarding the Zn environment in pathological calcifications made of apatite determined by X-ray absorption ...

... Somogyi, A., Martinez-Criado, G., Homs, A., Hernandez-Fenollosa, M. A., Vantelon, D., Ambacher, O. "Formation of Si clusters in AlGaN: A study of local structure" Applied Physics Letters., 90(18): art.n° 181129. (2007). ...

... Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., Duboz, J.Y. "AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging". Paper presented at the Sensors, Systems, and Next ...