RECHERCHER

... Geandier, G., Faurie, D., Renault, P.O., Thiaudière, D., Le Bourhis, E. "In situ monitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate" Journal of Applied Crystallography., 47(1): 181-187. (2014). ...

... Faurie, D., Renault, P.O., Le Bourhis, E., Geandier, G., Goudeau, P., Thiaudiere, D. "Mastering the biaxial stress state in nanometric thin films on flexible substrates" Applied Surface Science., 306: 70–74. (2014). ...

... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...

... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...

... Djaziri, S., Renault, P.O., Le Bourhis, E., Goudeau, P., Faurie, D., Geandier, G., Mocuta, C., Thiaudiere, D. "Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates" Journal of Applied Physics., 116(9): art ...

... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...

... Bousige, C., Rols, S., Paineau, E., Rouzière, S., Mocuta, C., Kataura, H., Launois, P. "In situ X-ray diffraction observation of two-step fullerene coalescence in carbon peapods" Europhysics Letters., 103(6): art.n° 66002. (2013). ...

... Beurrot-Borgarino, S., Huneau, B., Verron, E., Rublon, P. "Strain-induced crystallization of carbon black-filled natural rubber during fatigue measured by in situ synchrotron X-ray diffraction" International Journal of Fatigue., 47: 1–7. (2013). ...

... Barata, C., Rocha, F., Andrejkovièová, S., Reguer, S. "Synchrotron SR-XRD analysis of ground micro samples from gilded Portuguese baroque retables" Paper presented at the XV International Clay Conference, 07-11 July 2013 Rio de Janeiro - Brazil. Poster. ...

... Baimpas, N., Le Bourhis, E., Eve, S., Thiaudière, D., Hardie, C., Korsunsky, A.M. "Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with Focused Ion Beam patterning for do evaluation" Thin Solid Films., 549: 245-250. ...