RECHERCHER

... Monnier, J., Reguer, S., Foy, E., Testemale, D., Mirambet, F., Saheb, M., Dillmann, P., Guillot, I. "XAS and XRD in situ characterisation of reduction and reoxidation processes of iron corrosion products involved in atmospheric corrosion" Corrosion ...

... Mohacsi, I., Karvinen, P., Vartiainen, I., Guzenko, V.A., Somogyi, A., Kewish, C.M., Mercere, P., David, C. "High-efficiency zone-plate optics for multi-keV X-ray focusing" Journal of Synchrotron Radiation., 21(3): 497-501. (2014). ...

... Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013). ...

... Hild, F., Roux, S., Helena Jin, Cesar Sciammarella, Cosme Furlong, Sanichiro Yoshida "On the Resolution of Local and Global DIC Approaches" In Imaging Methods for Novel Materials and Challenging Applications, Volume 3: 221-225: Springer, 2013. ISBN: 978-1 ...

... Guillamet, R., Lagay, N., Mocuta, C., Lagrée, P.Y., Carbone, G., Décobert, J. "Micro-characterization and three dimensional modeling of very large waveguide arrays by selective area growth for photonic integrated circuits" Journal of Crystal Growth., 370: ...

... Gibaud, A., Topic, M., Corbel, G., Briois, V., Thiaudiere, D., Pineda-Vargasb, C.A., Ntsoanee, T. "X-ray scattering and EXAFS studies of Pt1-xVx alloys" Journal of Alloys and Compounds., 562: 95-98. (2013). ...

... Gervais, C., Languille, M.A., Reguer, S., Gillet, M., Vicenzi, E.P., Chagnot, S., Baudelet, F., Bertrand, L. "“Live” Prussian blue fading by time-resolved X-ray absorption spectroscopy" Applied Physics A: Materials Science & Processing., 111(1): 15-22. ...

... Gervais, C., Languille, M.A., Reguer, S., Gillet, M., Pelletier, S., Garnier, C., Vicenzi, E.P., Bertrand, L. "Why Does Prussian Blue Fade? Understanding the Role(s) of the Substrate" Journal of Analytical Atomic Spectrometry., 28(10): 1600-1609. (2013) ...

... Faurie, D., Geandier, G., Renault, P.O., Le Bourhis, E., Thiaudiere, D. "Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure" Thin Solid Films., 530: 25-29. (2013). ...

... Emprin, B., Troussel, P., Villette, B., Delmotte, F., Proceedings of SPIE "Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer" Paper presented at the Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: ...