RECHERCHER

... Sadat, T., Faurie, D., Thiaudière, D., Mocuta, C., Tingaud, D., Dirras, G. "Lattice Strain Evolutions in Ni-W Alloys during a Tensile Test Combined with Synchrotron X-ray Diffraction" Materials., 13(18): art.n° 4027. (2020). ...

... Puccio, E., Todaro, M., Lo Cicero, U., Sciortino, L., Laurent, P., Ferrando, P., Giglia, A., Nannarone, S., Barbera, M. "Synchrotron x-ray transmission measurements and modeling of filters investigated for Athena" Journal of Astronomical Telescopes, ...

... Gueriau, P., Bernard, S., Farges, F., Mocuta, C., Dutheil, D.B., Adatte, T., Bomou, B., Godet, M., Thiaudière, D., Charbonnier, S., Bertrand, L. "Oxidative conditions can lead to exceptional preservation through phosphatization" Geology., 48(12): 1164 ...

... Gueriau, P., Réguer, S., Leclercq, N., Cupello, C., Brito, P.M., Jauvion, C., Morel, S., Charbonnier, S., Thiaudière, D., Mocuta, C. "Visualizing mineralization processes and fossil anatomy using synchronous synchrotron X-ray fluorescence and X-ray ...

... Shao, H., Xu, K., Wu, Y.C., Iadecola, A., Liu, L., Ma, H., Qu, L., Raymundo-Piñero, E., Zhu, J., Lin, Z., Taberna, P.L., Simon, P. "Unraveling the Charge Storage Mechanism of Ti3C2Tx MXene Electrode in Acidic Electrolyte" ACS Energy Letters., 5(9): 2873 ...

... Manté, C., Cornu, S., Borschneck, D., Mocuta, C., van den Bogaert, R. "Detecting the Guttman effect with the help of ordinal correspondence analysis in synchrotron X-ray diffraction data analysis" Journal of Applied Statistics., 49(2): 291-316. (2022). ...

... Reguer, S., Kergourlay, F., Foy, E., Neff, D., Vantelon, D., Cotte, M., Mirambet, F., Dillmann, P. "XANES at the Cl K-edge as a relevant technique to reveal the iron archaeological artefact dechlorination treatments" Journal of Analytical Atomic ...

... Une troisième vidéo sous-titrée en français (VFSTF) et doublée en langue des signes française (LSF) est disponible. ...

... Cornelius, T.W., Mocuta, C., Escoubas, S., Lima, L.R.M., Araujo, E.B., Kholkin, A.L., Thomas, O. "Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction" Materials., 13(15): art.n° . (2020). ...

... Torrengo, S., Eichert, D., Mazel, Y., Bernard, M., Ménesguen, Y., Lépy, M.C., Nolot, E. "Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis" ...