RECHERCHER

... Cornelius, T.W., Mocuta, C., Escoubas, S., Merabet, A., Texier, M., Lima, E.C., Araujo, E.B., Kholkin, A.L., Thomas, O. "Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition" Journal of Applied ...

... Le carbone peut adopter de nombreuses formes en fonction de la molécule qui le renferme, on parle d’« espèces » chimiques distinctes. La « spéciation » des matériaux carbonés est généralement établie par des méthodes qui ...

... Feifel, R., Eland, J.H.D., Carniato, S., Selles, P., Püttner, R., Koulentianos, D., Marchenko, T., Journel, L., Guillemin, R., Goldsztejn, G., Travnikova, O, Ismail, I., Cunha de Miranda, B., Lago, A.F., Céolin, D., Lablanquie, P., Penent, F., ...

... van Stiphout, K., Geenen, F.A., De Schutter, B., Santos, N.M., Miranda, S.M.C., Joly, V., Detavernier, C., Pereira, L.M.C., Temst, K., Vantomme, A. "Formation of ultrathin Ni germanides: solid-phase reaction, morphology and texture" Journal of Physics D : ...

... Arndt, B., Borgatti, F., Offi, F., Phillips, M., Parreira, P., Meiners, T., Menzel, S., Skaja, K., Panaccione, G., MacLaren, D.A., Waser, R., Dittmann, R. "Spectroscopic Indications of Tunnel Barrier Charging as the Switching Mechanism in Memristive ...

... Marchenko, T., Goldsztejn, G., Jänkälä, K., Travnikova, O., Journel, L., Guillemin, R., Sisourat, N., Céolin, D., Žitnik, M., Kavčič,M., Bučar,K., Mihelič,A., Cunha de Miranda,B., Ismail,I., Lago, A.F., Gel’mukhanov, F., Püttner, R., Piancastelli, M.N., ...

... Cudazzo, P., Gatti, M. "Collective charge excitations of the two-dimensional electride Ca2N" Physical Review B., 96(12): art.n° 125131. (2017). ...

... Zimmermann, P., Bouldi, N., Hunault, M.O.J.Y., Sikora, M., Ablett, J.M., Rueff, J.P., Lebert, B.W., Sainctavit, P., De Groot, F.M.F., Juhin, A. "1s2p Resonant Inelastic X-ray Scattering Magnetic Circular Dichroism as a probe for the local and non-local ...

... Többens, D.M., Schorr, S. "The use of anomalous X-ray diffraction as a tool for the analysis of compound semiconductors" Semiconductor Science and Technology., 32(13): art.n° 103002. (2017). ...

... Gueriau, P., Rueff, J.P., Bernard, S., Kaddissy, J.A., Goler, S., Sahle, C.J., Sokaras, D., Wogelius, R.A., Manning, P.L., Bergmann, U., Bertrand, L. "Non-invasive synchrotron-based X-Ray Raman scattering discriminates carbonaceous compounds in ancient ...