RECHERCHER
Résultats de la recherche ""
Heteroepitaxial growth of silicon on GaAs via low-temperature plasma-enhanced chemical vapor deposition
Publié le 20/02/2019
... Hamon, G., Vaissiere, N., Lausecker, C., Gariou, R., Chen, W., Alvarez, J., Maurice, J.L., Patriarche, G., Largeau, L., Decobert, J., Kleider, P., Roca i Cabarrocas, P. "Heteroepitaxial growth of silicon on GaAs via low-temperature plasma-enhanced ...
Recoil-induced ultrafast molecular rotation probed by dynamical rotational Doppler effect
Publié le 20/02/2019
... Céolin, D., Liu, J.C., Vaz da Cruz, V., Ågren, H., Journel, L., Guillemin, R., Marchenko, T., Kushawaha, R.K., Piancastelli, M.N., Püttner, R., Simon, M., Gel’mukhanov, F. "Recoil-induced ultrafast molecular rotation probed by dynamical rotational Doppler ...
Oxygen states in La- and Rh-doped Sr2IrO4 probed by angle-resolved photoemission and O K-edge resonant inelastic x-ray scattering
Publié le 20/02/2019
... Ilakovac, V., Louat, A., Nicolaou, A., Rueff, J.P., Joly, Y., Brouet, V. "Oxygen states in La- and Rh-doped Sr2IrO4 probed by angle-resolved photoemission and O K-edge resonant inelastic x-ray scattering" Physical Review B., 99(3): art.n° 035149. (2019). ...
Defect State Analysis in Ion‐Irradiated Amorphous‐Silicon Heterojunctions by HAXPES
Publié le 20/02/2019
... Lee, M.I., Defresne, A., Plantevin, O., Céolin, D., Roca i Cabarrocas, P., Tejeda, A. "Defect State Analysis in Ion‐Irradiated Amorphous‐Silicon Heterojunctions by HAXPES" Physica Status Solidi - Rapid Research Letters., 13(5): art.n° 1800655. (2019). ...
Impurity-enhanced solid-state amorphization: the Ni-Si thin lm reaction altered by nitrogen
Publié le 20/02/2019
... van Stiphout, K., Geenen, F.A., Santos, N.M., Miranda, S.M.C., Joly, V., Demeulemeester, J., Detavernier, C., Kremer, F., Pereira, L.M.C., Temst, K., Vantomme, A. "Impurity-enhanced solid-state amorphization: the Ni-Si thin lm reaction altered by nitrogen ...
Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction
Publié le 15/01/2019
... Purushottam Raj Purohit, R.R.P., Arya, A., Bojjawar, G., Pelerin, M., Van Petegem, S., Proudhon, H., Mukherjee, S., Gerard, C., Signor, L., Mocuta, C., Casati, N., Suwas, S., Chokshi, A.H., Thilly, L. "Revealing the role of microstructure architecture on ...
Vanadium Doping Enhanced Electrochemical Performance of Molybdenum Oxide in Lithium‐Ion Batteries
Publié le 10/01/2019
... Qu, G., Wang, J., Liu, G., Tian, B., Su, C., Chen, Z., Rueff, J.P., Wang, Z. "Vanadium Doping Enhanced Electrochemical Performance of Molybdenum Oxide in Lithium‐Ion Batteries" Advanced Functional Materials., 29(2): art.n° 1805227. (2019). ...
Fracture behavior of Ni-W alloy probed by in situ synchrotron X-ray diffraction
Publié le 04/01/2019
... Sadat, T., Faurie, D., Tingaud, D., Mocuta, C., Thiaudiere, D., Dirras, G. "Fracture behavior of Ni-W alloy probed by in situ synchrotron X-ray diffraction" Materials Letters., 239: 116-119. (2019). ...
Structural Study of Cu(II):Glycine Solution by X-ray Absorption Spectroscopy
Publié le 20/12/2018
... Klaiphet, K., Saisopa, T., Pokapanich, W., Tangsukworakhun, S., Songsiriritthigul, C., Saiyasombat, C., Céolin, D., Songsiriritthigul, P. "Structural Study of Cu(II):Glycine Solution by X-ray Absorption Spectroscopy" Journal of Physics Conferences Series. ...
Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories
Publié le 20/12/2018
... Kazar Mendes, M., Martinez, E., Ablett, J.M., Veillerot, M., Gassilloud, R., Bernard, M., Renault, O., Rueff, J.P., Barrett, N. "Chemistry of resistivity changes in TiTe/Al2O3 conductive-bridge memories" Scientific Reports., 8: art.n° 17919. (2018). ...