RECHERCHER

... Sinyakova, T., Bomme, C., Bourassin-Bouchet, C., Chopineau, L., Cubaynes, D., Dakroub, L., Garcia, G.A., Pandey, A.K., Papagiannouli, I., Guilbaud, O., Quéré, F., Klisnick, A. "Temporal metrology for advanced ultrashort XUV sources" Journal of Physics ...

... Une troisième vidéo sous-titrée en français (VFSTF) et doublée en langue des signes française (LSF) est disponible. ...

... Cornelius, T.W., Mocuta, C., Escoubas, S., Lima, L.R.M., Araujo, E.B., Kholkin, A.L., Thomas, O. "Piezoelectric Properties of Pb1−xLax(Zr0.52Ti0.48)1−x/4O3 Thin Films Studied by In Situ X-ray Diffraction" Materials., 13(15): art.n° . (2020). ...

... Ganjitabar, H., Garcia, G.A., Nahon, L., Powis, I. "Decoupling vibration and electron energy dependencies in the photoelectron circular dichroism of a terpene, 3-carene" Journal of Chemical Physics., 153(3): art.n° 034302. (2020). ...

... Tang, X., Lin, X., Garcia, G.A., Loison, J.C., Fittschen, C., Gu, X., Zhang, W., Nahon, L. "Threshold photoelectron spectroscopy of the methoxy radical" Journal of Chemical Physics., 153(3): art.n° 031101. (2020). ...

... Aliouat, M.Y., Ksenzov, D., Escoubas, S., Ackermann, J., Thiaudière, D., Mocuta, C., Benoudia, M.C., Duche, D., Thomas, O., Grigorian, S. "Direct Observations of the Structural Properties of Semiconducting Polymer: Fullerene Blends under Tensile ...

... Thakur, N., Giuliani, A., Nahon, L., Castellanos, S. "Photon-induced Fragmentation of Zinc-based Oxoclusters for EUV Lithography Applications" Journal of Photopolymer Science and Technology., 33(2): 153-158. (2020). ...

... Mercier, X., Faccinetto, A., Batut, S., Vanhove, G., Bozanic, D.K., Hrodmarsson, H.R., Garcia, G.A., Nahon, L. "Selective identification of cyclopentaring-fused PAHs and side-substituted PAHs in a low pressure premixed sooting flame by photoelectron ...

... Tholapi, R., Gallard, M., Burle, N., Guichet, C., Escoubas, S., Putero, M., Mocuta, C., Richard, M.I., Chahine, R., Sabbione, C., Bernard, M., Fellouh, L., Noé, P., Thomas, O. "Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements ...

... Manté, C., Borschneck, D., Mocuta, C., van den Bogaert, R., Montagne, D., Cammas, C., Cornu, S. "Combining wavelets with statistical inference to map the mineralogical composition of pedological features from synchrotron X-ray diffraction data" SN Applied ...