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... Gao, L., Wang, X., Ye, X., Wang, W., Liu, Z., Qin, S., Hu, Z., Lin, H.J., Weng, S.C., Chen, S.T., Ohresser, P., Baudelet, F., Yu, R., Jin, C., Long, Y. "Near-Room-Temperature Ferrimagnetic Ordering in a B-Site-Disordered 3d–5d-Hybridized Quadruple ...

... Liu, H., Zakhtser, A., Naitabdi, A., Rochet, F., Bournel, F., Salzemann, C., Petit, C., Gallet, J.J., Jie, W. "Operando Near Ambient Pressure XPS Study of the CO Oxidation Reaction on the Oxide/Metal Model Catalyst ZnO/Pt(111)" ACS Catalysis., 9(11): ...

... Zhang, Z., Chen, Z., Bouaziz, M., Giorgetti, C., Yi, H., Avila, J., Tian, B., Shukla, A., Perfetti, L., Fan, D., Li, Y., Bendounan, A. "Direct Observation of Band Gap Renormalization in Layered Indium Selenide" ACS Nano., 13(11): 13486-13491. (2019). ...

... Poggini, L., Londi, G., Milek, M., Naim, A., Lanzilotto, V., Cortigiani, B., Bondino, F., Magnano, E., Otero, E., Sainctavit, P., Arrio, M.A., Juhin, A., Marchivie, M., Khusniyarov, M.M., Totti, F., Rosa, P., Mannini, M. "Surface effects on a photochromic ...

... Martinez, B., Plamont, R., Greboval, C., Rastogi, P., Prado, Y., Qu, J., Chu, A., Livache, C., Xu, X., Cruguel, H., Ithurria, S., Silly, M.G., Goubet, N., Lhuillier, E. "Azobenzene as Light-Activable Carrier Density Switches in Nanocrystals" Journal of ...

... Meng, J., Chen, K., Mijiti, Y., Chen, D., Choueikani, F., Zou, Z., Wang, L., Mu, G., Geng, W., Kong, Q., Jiang, A., Ning, X.J., Weng, T.C. "Charge-Transfer-Induced Interfacial Exchange Coupling at the Co/BiFeO3 Interface" Physical Review Applied., 12(4): ...

... Nurk, G., Kooser, K., Korjus, O., Kanarbik, R., Urpelainen, S., Käämbre, T., Joost, U., Kook, M., Kodu, M., Möller, P., Kivi, I., Vestli, M., Gallet, J.J., Bournel, F., Kukk, E., Lust, E. "Operando NAP-HT-XPS and Impedance Spectroscopy Study of Pulsed ...

... Khalil, L., Pierucci, D., Papalazarou, E., Chaste, J., Silly, M.G., Sirotti, F., Eddrief, M., Perfetti, L., Lhuillier, E., Ouerghi, A. "Electronic coupling in the F4-TCNQ/single-layer GaSe heterostructure" Physical Review Materials., 3(8): art.n° 084002. ...