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... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...

... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...

... Dupuis, V., Tamion, C. "Atomic relaxation effects on magnetism in CoPt nanoalloys" Journal of Physics Conferences Series., 521: art.n° 012001. (2014). ...

... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...

... Bulou, H., Scheurer, F., Goyhenex, C., Speisser, V., Romeo, M., Carrière, B., Moreau, N., Repain, V., Chacon, C., Girard, Y., Lagoute, J., Rousset, S., Otero, E., Ohresser, P. "Thermodynamics versus kinetics in a morphology transition of nanoparticles" ...

... Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., Caillaud, T., Ducret, J.E., Foelsner, W., Gilles, D., Gilleron, F., Pain, J.C., Poirier, M., Serres, F., Silvert, V., Soullie, G., Turck-Chieze, S., Villette, B. "X-ray ...

... Primot, J., Rizzi, J., Mercère, P., Idir, M., Bon, P., Wattellier, B., Druart, G., Vincent, G., Haïdar, R., Weitkamp, T., Guérineau, N., Monneret, S., Atsushi Momose, Wataru Yashiro "Multi-lateral shearing interferometry: Principle and application to X ...

... Vo-Van, C., Schumacher, S., Coraux, J., Sessi, V., Fruchart, O., Brookes, N.B., Ohresser, P., Michely, T. "Magnetism of cobalt nanoclusters on graphene on iridium" Applied Physics Letters., 99(14): art.n° 142504. (2011). ...

... Rizzi, J., Weitkamp, T., Guérineau, N., Idir, M., Mercère, P., Druart, V., Vincent, G., Da Silva, P., Primot, J. "Quadriwave lateral shearing interferometry in an achromatic and continuously self-imaging regime for future x-ray phase imaging" Optics ...