RECHERCHER
Résultats de la recherche ""
Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC(0001¯ )
Publié le 10/11/2016
... Mathieu, C., Barrett, N., Rault, J., Mi, Y.Y., Zhang, B., de Heer W.A., Berger, C., Conrad, E.H., Renault, O. "Microscopic correlation between chemical and electronic states in epitaxial graphene on SiC(0001¯ )" Physical Review B., 83(23): art.n° 235436. ...
Lanthanum diffusion in the TiN/LaOx/HfSiO/SiO2/Si stack
Publié le 10/11/2016
... Martinez, E., Ronsheim, P., Barnes, J.P., Rochat, N., Py, M., Hatzistergos, M., Renault, O., Silly, M.G., Sirotti, F., Bertin, F., Gambacorti, N. "Lanthanum diffusion in the TiN/LaOx/HfSiO/SiO2/Si stack" Microelectronic Engineering., 88(7): 1349-1352. ...
Coherent scattering from silicon monocrystal surface
Publié le 10/11/2016
... Livet, F., Beutier, G., de Boissieu, M., Ravy, S., Picca, F., Le Bolloc'h, D., Jacques, V.L.R. "Coherent scattering from silicon monocrystal surface" Surface Science., 605(3-4): 390-395. (2011). ...
Photoemission induced bias in two-dimensional silicon pn junctions
Publié le 10/11/2016
... Lavayssière, M., Renault, O., Mariolle, D., Veillerot, M., Barnes, J.P., Hartmann, J.M., Leroy, J., Barrett, N. "Photoemission induced bias in two-dimensional silicon pn junctions" Applied Physics Letters., 99(20): art.n° 202107. (2011). ...
Random local strain effects in the relaxor ferroelectric BaTi1-xZrxO3: experimental and theoretical investigation
Publié le 10/11/2016
... Laulhé, C., Hippert, F., Kreisel, J., Pasturel, A., Simon, A., Hazemann, J. L., Bellissent, R., Cuello, G.J. "Random local strain effects in the relaxor ferroelectric BaTi1-xZrxO3: experimental and theoretical investigation" Phase Transitions A ...
The survival of glycine in interstellar ices: A coupled investigation using NEXAFS experiments and theoretical calculations
Publié le 10/11/2016
... Lattelais, M., Risset, O., Pilme, J., Pauzat, F., Ellinger, Y., Sirotti, F., Silly, M.G., Parent, P., Laffon, C. "The survival of glycine in interstellar ices: A coupled investigation using NEXAFS experiments and theoretical calculations" International ...
Growth of aligned multi-walled carbon nanotubes: First in situ and time-resolved X-ray diffraction analysis
Publié le 10/11/2016
... Landois, P., Rouziére, S., Pinault, M., Porterat, D., Mocuta, C., Elkaim, E., Mayne-L'Hermite, M., Launois, P. "Growth of aligned multi-walled carbon nanotubes: First in situ and time-resolved X-ray diffraction analysis" Physica Status Solidi B., 248(11): ...
Crystal Chemistry and Electronic Structure of the Photovoltaic Buffer Layer, (In1-xAlx)2S3
Publié le 10/11/2016
... Lafond, A., Rocquefelte, X, Paris, M., Guillot-Deudon, C., Jouenne, V. "Crystal Chemistry and Electronic Structure of the Photovoltaic Buffer Layer, (In1-xAlx)2S3" Chemistry of Materials., 23(23): 5168–5176. (2011). ...
Properties of Hollow Molecules Probed by Single-Photon Double Ionization
Publié le 10/11/2016
... Lablanquie, P., Penent, F., Palaudoux, J., Andric, L., Selles, P., Carniato, S., Bucar, K., Žitnik, M., Huttula, M., Eland, J.H.D., Shigemasa, E., Soejima, K., Hikosaka, Y., Suzuki, I. H., Nakano, M., Ito, K. "Properties of Hollow Molecules Probed by ...
Bulk Dislocation Core Dissociation Probed by Coherent X Rays in Silicon
Publié le 10/11/2016
... Jacques, V.L.R., Ravy, S., Le Bolloc'h, D., Pinsolle, E., Sauvage-Simkin, M., Livet, F. "Bulk Dislocation Core Dissociation Probed by Coherent X Rays in Silicon" Physical Review Letters., 106(6): art.n° 065502. (2011). ...