RECHERCHER

... Reverchon, J.L., Robo, J.A., Truffer, J.P., Caumes, J.P., Idir, M., Brault, J., Duboz, J.Y. "AlGaN-based focal plane arrays for selective UV imaging at 310nm and 280nm and route toward deep UV imaging". Paper presented at the Sensors, Systems, and Next ...

... Ravy, S., Le Bolloc'h, D., Currat, R., Fluerasu, A., Mocuta, C., Dkhil, B. "SrTiO3 Displacive Transition Revisited via Coherent X-Ray Diffraction" Physical Review Letters., 98(10): art.n° 105501. (2007). ...

... Ravy, S., Itié, J.P., Polian, A., Hanfland, M. "High-Pressure Study of X-Ray Diffuse Scattering in Ferroelectric Perovskites" Physical Review Letters., 99(11): art.n° 117601. (2007). ...

... Ravy, S. "Diffuse X-ray scattering studies of molecular conductors" Annual Reports Section C. Physical Chemistry., 103: 223-260. (2007). ...

... Reverchon, J.L., Bansropun, S., Robo, J.A., Truffer, J.P., Costard, E., Frayssinet, E., Brault, J., Semond, F., Duboz, J.Y., Idir, M. "First demonstration and performances of AlGaN based focal plane array for deep-UV imaging" Proceedings of SPIE., 7474: ...

... Renaud, G., Abeillé, G., Langlois, F., Malik, J., Elkaim, E., Fonda, E., "Continuous scan at Synchrotron SOLEIL" Paper presented at the ICALEPCS'2009, 12th Int. Conf. on Accelerator and Large Experimental Physics Control Systems - October 12-16, 2009. ...

... Poienar, M., Damay, F., Martin, C., Hardy, V., Maignan, A., André, G. "Structural and magnetic properties of CuCr1−xMgxO2 by neutron powder diffraction" Physical Review B., 79(1): art.n° 014412. (2009). ...

... Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Nelson, A.J., Sobierajski, R., Krzywinski, J., Chalupsky, J., Abreu, E., Bajt, S., Bornath, T., Burian, T., Chapman, H., Cihelka, J., Döppner, T., Düsterer, S., Dzelzainis, T., Fajardo, M ...

... Modi, M.H., Rai, S.K., Thomasset, M., Lodha, G.S., Idir, M. "Effect of surface roughness on multilayer film growth" European Physical Journal.-Special Topics., 167(1): 27-32. (2009). ...

... Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009). ...