RECHERCHER
Résultats de la recherche ""
Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography
Publié le 10/11/2016
... Medjoubi, K., Bonissent, A., Leclercq, N., Langlois, F., Mercere, P., Somogyi, A., Barry Lai "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography" Paper presented at the X-Ray Nanoimaging: Instruments and Methods, San ...
Pressure effect on the magnetic order of LuFe2O4
Publié le 10/11/2016
... Makarova, O.L., Bourgeois, J., Poienar, M., Mirebeau, I., Kichanov, S.E., André, G., Elkaim, E., Hanfland, M., Hervieu, M., Maignan, A., Haines, J., Rouquette, J., Martin, C., Damay, F. "Pressure effect on the magnetic order of LuFe2O4" Applied Physics ...
Impact of laser on bismuth thin-films
Publié le 10/11/2016
... Laulhé, C., Cammarata, M., Servol, M., Dwayne Miller, R.J., Hada, M., Ravy, S. "Impact of laser on bismuth thin-films" European Physical Journal.-Special Topics., 222(5): 1277-1285. (2013). ...
High efficiency multilayer gratings for monochromators in the energy range from 500 eV to 2500 eV
Publié le 10/11/2016
... Lagarde, B., Choueikani, F., Capitanio, B., Ohresser, P., Meltchakov, E., Delmotte, F., Krumrey, M., Polack, F. "High efficiency multilayer gratings for monochromators in the energy range from 500 eV to 2500 eV" Journal of Physics Conferences Series., 425 ...
Design and Fabrication of a 1 THz Backward Wave Amplifier
Publié le 10/11/2016
... Paoloni, C., Di Carlo, A., Brunetti, F., Mineo, M., Ulisse, G., Durand, A.J., Krozer, V., Kotiranta, M., Fiorello, A.M., Dispenza, M., Secchi, A., Zhurbenko, V., Bouamrane, F., Bouvet, T., Megtert, S., Tamburri, E., Cojocaru, C.S., Gohier, A. "Design and ...
Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis
Publié le 10/11/2016
... Modi, M.H., Lodha, G.S., Thomasset, M., Idir, M., Alka B. Garg, R. Mittal, R. Mukhopadhyay "Study of Micro Roughness Parameters and Growth Characteristics of NbC/Si Multilayer using Layer by Layer Power Spectral Density Analysis" Paper presented at the ...
Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5
Publié le 10/11/2016
... Ménesguen,, Lépy, M.C. "Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5<E<28keV" X-Ray Spectrometry., 40(6): 411-416. (2011). ...
Coherent scattering from silicon monocrystal surface
Publié le 10/11/2016
... Livet, F., Beutier, G., de Boissieu, M., Ravy, S., Picca, F., Le Bolloc'h, D., Jacques, V.L.R. "Coherent scattering from silicon monocrystal surface" Surface Science., 605(3-4): 390-395. (2011). ...
Random local strain effects in the relaxor ferroelectric BaTi1-xZrxO3: experimental and theoretical investigation
Publié le 10/11/2016
... Laulhé, C., Hippert, F., Kreisel, J., Pasturel, A., Simon, A., Hazemann, J. L., Bellissent, R., Cuello, G.J. "Random local strain effects in the relaxor ferroelectric BaTi1-xZrxO3: experimental and theoretical investigation" Phase Transitions A ...
Growth of aligned multi-walled carbon nanotubes: First in situ and time-resolved X-ray diffraction analysis
Publié le 10/11/2016
... Landois, P., Rouziére, S., Pinault, M., Porterat, D., Mocuta, C., Elkaim, E., Mayne-L'Hermite, M., Launois, P. "Growth of aligned multi-walled carbon nanotubes: First in situ and time-resolved X-ray diffraction analysis" Physica Status Solidi B., 248(11): ...