RECHERCHER

... Ablett, J.M., Woicik, J.C., Tokei, Z., List, S., Dimasi, E. "Phase identification of self-forming Cu–Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structure" Applied Physics Letters., 94(4): art.n° 042112. (2009 ...

... Zamoum, F., François, M., Tobola, J., Elkaim, E., Vilasi, M. "Resonant X-ray diffraction of alpha-phase Mo0.15Ru0.85Si and crystal stability calculation in Mo–Ru–Si system (FeSi and CsCl types)" Intermetallics., 16(11-12): 1237-1244. (2008). ...

... Rueff, J.P., Mezouar, M., Acet, M. "Short-range magnetic collapse of Fe under high pressure at high temperatures observed using x-ray emission spectroscopy" Physical Review B., 78(10): art.n° 100405. (2008). ...

... Le Bolloc'h, D., Jacques, V.L.R., Kirova, N., Dumas, J., Ravy, S., Marcus, J., Livet, F. "Observation of Correlations Up To the Micrometer Scale in Sliding Charge-Density Waves" Physical Review Letters., 100(9): art.n° 096403. (2008). ...

... Jarrige, I, Rueff, J.P., Shieh, S. R., Taguchi, M., Ohishi, Y., Matsumura, T., Wang, C.P., Ishii, H., Hiraoka, N., Cai, Y.Q. "Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering" Physical Review Letters., 101(12): art.n ...

... Hague, C.F., Mariot, J.-M., Ilakovac, V., Delaunay, R., Marsi, M., Sacchi, M., Rueff, J.P., Felsch, W. "Charge transfer at the metal-insulator transition in V2O3 thin films by resonant inelastic x-ray scattering" Physical Review B., 77(4): art.n° 045132. ...

... Bowerman, B., Ablett, J.M., Milian, L., Adams, J., Ludwig, H., Todosow, M. "An infiltration manufacturing process for nuclear fuels". Paper presented at the 4th International Topical Meeting on High Temperature Reactor Technology, HTR 2008 -28/09-01/10 ...

... Abbamonte, P., Graber, T., Reed, J.P., Smadici, S., Yeh, C.L., Shukla, A., Rueff, J.P., Ku, W. "Dynamical reconstruction of the exciton in LiF with inelastic x-ray scattering" PNAS., 105(34): 12159-12163. (2008). ...

... Rueff, J.P., Raymond, S., Yaresko, A., Braithwaite, D., Leininger, P., Vankó, G., Huxley, A., Rebizant, J., Sato, N. "Pressure-induced f-electron delocalization in the U-based strongly correlated compounds UPd3 and UPd2Al3: Resonant inelastic x-ray ...

... Rueff, J.P., Hague, C.F., Itié, J.P., Mariot, J.M., Raymond, S., Taguchi, M., Yaresko, A. "Localization-delocalization of f-electron: A novel view by resonant inelastic X-ray scattering under high pressure". Paper presented at the . JOURNAL OF ELECTRON ...