RECHERCHER

... Haag, S.T., Richard, M.I., Favre-Nicollin, V., Welzel, U., Jeurgens, L.P.H., Ravy, S., Richter, G., Mittemeijer, E.J., Thomas, O. "In situ coherent X-ray diffraction of isolated core-shell nanowires" Thin Solid Films., 530: 113-119. (2013). ...

... Guillamet, R., Lagay, N., Mocuta, C., Lagrée, P.Y., Carbone, G., Décobert, J. "Micro-characterization and three dimensional modeling of very large waveguide arrays by selective area growth for photonic integrated circuits" Journal of Crystal Growth., 370: ...

... Guignard, M., Didier, C., Darriet, J., Bordet, P., Elkaïm, E., Delmas, C. "P2-NaxVO2 system as electrodes for batteries and electron-correlated materials" Nature Materials., 12(1): 74–80. (2013). ...

... Gibaud, A., Topic, M., Corbel, G., Briois, V., Thiaudiere, D., Pineda-Vargasb, C.A., Ntsoanee, T. "X-ray scattering and EXAFS studies of Pt1-xVx alloys" Journal of Alloys and Compounds., 562: 95-98. (2013). ...

... Gervais, C., Languille, M.A., Reguer, S., Gillet, M., Vicenzi, E.P., Chagnot, S., Baudelet, F., Bertrand, L. "“Live” Prussian blue fading by time-resolved X-ray absorption spectroscopy" Applied Physics A: Materials Science & Processing., 111(1): 15-22. ...

... Gervais, C., Languille, M.A., Reguer, S., Gillet, M., Pelletier, S., Garnier, C., Vicenzi, E.P., Bertrand, L. "Why Does Prussian Blue Fade? Understanding the Role(s) of the Substrate" Journal of Analytical Atomic Spectrometry., 28(10): 1600-1609. (2013) ...

... Gautier, R., Gautier, R., Hernandez, O., Audebrand, N., Bataille, T., Roiland, C., Elkaim, E., Le Pollès, L., Furet, E., Le Fur, E. "DFT-assisted structure determination of a1- and a2-VOPO4: new insights into the understanding of the catalytic ...

... Fertey, P., Alle, P., Wenger, E., Dinkespiler, B., Cambon, O., Haines, J., Hustache, S., Medjoubi, K., Picca, F., Dawiec, A., Breugnon, P., Delpierre, P., Mazzoli, C., Lecomte, C., "Diffraction studies under in situ electric field using a large-area ...

... Faurie, D., Geandier, G., Renault, P.O., Le Bourhis, E., Thiaudiere, D. "Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure" Thin Solid Films., 530: 25-29. (2013). ...

... Djaziri, S., Faurie, D., Renault, P.O., Le Bourhis, E., Goudeau, P., Geandier, G., Thiaudiere, D. "Yield surface of polycrystalline thin films as revealed by non-equibiaxial loadings at small deformation" Acta Materialia., 61(13): 5067-5077. (2013). ...