RECHERCHER

... Modi, M.H., Mercère, P., Idir, M. "High precision surface metrology using a phase retrieval method" Journal of Physics Conferences Series., 186: art.n° 012068. (2009). ...

... Mercère, P., Bachelard, R., Couprie, M. E., Idir, M., Chubar, O., Gautier, J., Lambert, G., Zeitoun, P., Bucourt, S., Dovillaire, G., Levecq, X., Kimura, H., Ohashi, H., Hara, T., Higashiya, A., Ishikawa, T., Nagasono, M., Yabashi, M. "Spatial ...

... Lee, R.W., Nagler, B., Zastrau, U., Fäustlin, R.R., Vinko, S.M., Whitcher, T., Sobierajski, R., Krzywinski, J., Juha, L., Nelson, A.J., Bajt, S., Budil, K., Cauble, R.C., Bornath, T., Burian, T., Chalupsky, J., Chapman, H., Cihelka, J., Döppner, T., ...

... Brouet, V., Marsi, M., Mansart, B., Nicolaou, A., Taleb-Ibrahimi, A., Le Fevre, P., Bertran, F., Rullier-Albenque, F., Forget, A., Colson, D. "Nesting between hole and electron pockets in Ba(Fe1-xCox)2As2 (x=0–0.3) observed with angle-resolved ...

... Bonell, F., Andrieu, S., Bertran, F., Le Fevre, P., Taleb-Ibrahimi, A., Snoeck, E., Tiusan, C.V., Montaigne, F. "MgO-Based Epitaxial Magnetic Tunnel Junctions Using Fe-V Electrodes" IEEE Transactions on magnetics., 45(10 (Sp Iss)): 3467-3471. (2009). ...

... Krüger, P., Bourgeois, S., Dominici, B., Magnan, H, Chandesris, D., Le Fèvre, P., Floreano, L., Cossaro, A., Verdini, A., Morgante, A. "Defects at the TiO2(1 0 0) surface probed by resonant photoelectron diffraction" Surface Science., 601(18): 3952-3955. ...

... Floriot, J., Levecq, X., Bucourt, S., Thomasset, M., Polack, F., Idir, M., Mercère, P., Brochet, S., Moreno, T., Wolfgang Osten, Christophe Gorecki, Erik L. Novak "Surface metrology with a stitching Shack-Hartmann profilometric head" Paper presented at ...

... De Padova, P., Favre, L., Berbezier, I., Olivieri, B., Generosi, A., Paci, B., Rossi Albertini, V., Perfetti, P., Quaresima, C., Mariot, J.M., Taleb-Ibrahimi, A., Richter, M.C., Heckmann, O., D’Orazio, F., Lucari, F., Hricovini, K. "Structural and ...

... De Padova, P., Ayoub, J.P., Berbezier, I., Mariot, J.-M., Taleb-Ibrahimi, A., Richter, M.C., Heckmann, O., Testa, A.M., Fiorani, D., Olivieri, B., Picozzi, S., Hricovini, K. "MnxGe1-x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID ...

... Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. ...