RECHERCHER
Résultats de la recherche ""
Tuning the transport properties of graphene films grown by CVD on SiC(0001): Effect of in situ hydrogenation and annealing
Publié le 10/11/2016
... Jabakhanji, B., Michon, A., Consejo, C., Desrat, W., Portail, M., Tiberj, A., Paillet, M., Zahab, A., Cheynis, F., Lafont, F., Schopfer, F., Poirier, W., Bertran, F., Le Fèvre, P., Taleb-Ibrahimi, A., D. Kazazis, D., Escoffier, W., Camargo, B.C., ...
Walking peptide on Au(110) surface: Origin and nature of interfacial process
Publié le 10/11/2016
... Humblot, V., Tejeda, A., Landoulsi, J., Vallée, A., Naitabdi, A., Taleb-Ibrahimi, A., Pradier, C.M. "Walking peptide on Au(110) surface: Origin and nature of interfacial process" Surface Science., 628: 21-29. (2014). ...
Tuning a Schottky barrier in a photoexcited topological insulator with transient Dirac cone electron-hole asymmetry
Publié le 10/11/2016
... Hajlaoui, M., Papalarazou, E., Mauchain, J., Perfetti, L., Taleb-Ibrahimi, A., Navarin, F., Monteverde, M., Auban-Senzier, P., Pasquier, C.R., Moisan, N., Boschetto, D., Neupane, M., Hasan, M.Z., Durakiewicz, T., Jiang, Z., Xu, Y., Miotkowski, I., Chen, Y ...
Characterization of subnanometric layers by grazing incidence X-ray reflectometry
Publié le 10/11/2016
... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...
X-ray broadband Ni/SiC multilayers: improvement with W barrier layers
Publié le 10/11/2016
... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...
MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography
Publié le 10/11/2016
... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...
Ultrafast filling of an electronic pseudogap in an incommensurate crystal
Publié le 10/11/2016
... Brouet, V., Mauchain, J., Papalarazou, E., Faure, J., Marsi, M., Lin, P.H., Taleb-Ibrahimi, A., Le Fevre, P., Bertran, F., Cario, L., Janod, E., Corraze, B., Ta Phuoc, V., Perfetti, L. "Ultrafast filling of an electronic pseudogap in an incommensurate ...
Large Temperature Dependence of the Number of Carriers in Co-Doped BaFe2As2
Publié le 10/11/2016
... Brouet, V., Lin, P.H., Texier, Y., Bobroff, J., Taleb-Ibrahimi, A., Le Fevre, P., Bertran, F., Casula, M. F., Werner, P., Biermann, S., Rullier-Albenque, F., Forget, A., Colson, D. "Large Temperature Dependence of the Number of Carriers in Co-Doped ...
Silicon intercalation into the graphene-SiC interface
Publié le 10/11/2016
... Wang, F., Shepperd, K., Hicks, J., Nevius, M.S., Tinkey, H., Tejeda, A., Taleb-Ibrahimi, A., Bertran, F., Le Fevre, P., Torrance, D.B., First, P.N., de Heer, W.A., Zakharov, A.A., Conrad, E.H. "Silicon intercalation into the graphene-SiC interface" ...
Electronic structure of epitaxial graphene grown on the C-face of SiC and its relation to the structure
Publié le 10/11/2016
... Tejeda, A., Taleb-Ibrahimi, A., de Heer, W.A., Berger, A., Conrad, E.H. "Electronic structure of epitaxial graphene grown on the C-face of SiC and its relation to the structure" New Journal of Physics., 14(12): art.n° 125007. (2012). ...