RECHERCHER

... Krüger, P., Bourgeois, S., Domenichini, B., Magnan, H, Chandesris, D., Le Fevre, P., Flank, A.M., Jupille, J., Floreano, L., Cossaro, A., Verdini, A., Morgante, A. "Defect States at the TiO2(110) Surface Probed by Resonant Photoelectron Diffraction" ...

... Jarrige, I, Rueff, J.P., Shieh, S. R., Taguchi, M., Ohishi, Y., Matsumura, T., Wang, C.P., Ishii, H., Hiraoka, N., Cai, Y.Q. "Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering" Physical Review Letters., 101(12): art.n ...

... Hague, C.F., Mariot, J.-M., Ilakovac, V., Delaunay, R., Marsi, M., Sacchi, M., Rueff, J.P., Felsch, W. "Charge transfer at the metal-insulator transition in V2O3 thin films by resonant inelastic x-ray scattering" Physical Review B., 77(4): art.n° 045132. ...

... Flammini, R., Wiame, F., Belkhou, R., Taleb-Ibrahimi, A., Spezzani, C., Moras, P., Crotti, C. "Thermal behavior of the Au/c-Si3N4/Si(111) interface" Journal of Applied Physics., 103(8): art.n° 083528. (2008). ...

... De Padova, P., Perfetti, P., Quaresima, C., Zema, N., Grazioli, C., Spezzani, C., Testa, A.M., Fiorani, D., Olivieri, B., Mariot, J.M., Taleb-Ibrahimi, A., Richter, M.C., Heckmann, O., Hricovini, K. "Resonant magnetic scattering of polarized x-rays at the ...

... De Padova, P., Ayoub, J.P., Berbezier, I., Perfetti, P., Quaresima, C., Testa, A.M., Fiorani, D., Olivieri, B., Mariot, J.-M., Taleb-Ibrahimi, A., Richter, M.C., Heckmann, O., Hricovini, K. "Mn0.06Ge0.94 diluted magnetic semiconductor epitaxially grown on ...

... Bowerman, B., Ablett, J.M., Milian, L., Adams, J., Ludwig, H., Todosow, M. "An infiltration manufacturing process for nuclear fuels". Paper presented at the 4th International Topical Meeting on High Temperature Reactor Technology, HTR 2008 -28/09-01/10 ...

... Abbamonte, P., Graber, T., Reed, J.P., Smadici, S., Yeh, C.L., Shukla, A., Rueff, J.P., Ku, W. "Dynamical reconstruction of the exciton in LiF with inelastic x-ray scattering" PNAS., 105(34): 12159-12163. (2008). ...

... Rueff, J.P., Raymond, S., Yaresko, A., Braithwaite, D., Leininger, P., Vankó, G., Huxley, A., Rebizant, J., Sato, N. "Pressure-induced f-electron delocalization in the U-based strongly correlated compounds UPd3 and UPd2Al3: Resonant inelastic x-ray ...

... Rueff, J.P., Hague, C.F., Itié, J.P., Mariot, J.M., Raymond, S., Taguchi, M., Yaresko, A. "Localization-delocalization of f-electron: A novel view by resonant inelastic X-ray scattering under high pressure". Paper presented at the . JOURNAL OF ELECTRON ...