RECHERCHER

... Zhang, X., Cappel, U.B., Jia, D., Zhou, Q., Du, J., Sloboda, T., Svanström, S., Johansson, F.O.L., Lindblad, A., Giangrisostomi, E., Ovsyannikov, R., Liu, J., Rensmo, H., Gardner, J.M., Johansson, E.M.J. "Probing and Controlling Surface Passivation of PbS ...

... Piquero-Zulaica, I., Abd El-Fattah, ZM., Popova, O., Kawai, S., Nowakowska, S., Matena, M., Enache, M., Stöhr, M., Tejeda, A., Taleb-Ibrahimi, A., Meyer, E., Ortega, J. E., Gade, L.H., Jung, T. A., Lobo-Checa, J. "Effective determination of surface ...

... Ohtsubo, Y., Yamashita, Y., Kishi, J., Ideta, S., Tanaka, K., Yamane, H., Rault, J.E., Le Fèvre, P., Bertran, F., Kimura, S. "Temperature-driven modification of surface electronic structure on bismuth, a topological border material" Journal of Physics D : ...

... Püttner, R., Marchenko, T., Guillemin, R., Journel, L., Goldsztejn, G., Céolin, D., Takahashi, O., Ueda, K., Lago, A.F., Piancastelli, M.N., Simon, M. "Si 1s−1, 2s−1 and 2p−1 lifetime broadening of SiX4 (X = F, Cl, Br, CH3) molecules: SiF4 anomalous ...

... Tisserond, E., Nilforoushan, N., Caputo, M., Alemany, P., Canadell, E., Khalil, L., Vobornik, I., Fujii, J., Das, P.K., Mézière, C., Batail, P., Pouget, J.P., Pasquier, C., Marsi, M., Monteverde, M. "Electronic structure of the α-(BEDT-TTF)2I3 surface by ...

... De nombreux acteurs privés sont aujourd'hui confrontés à des difficultés lorsqu’ils doivent caractériser finement la surface des matériaux. Le développement de techniques pratiques et fiables devrait cependant changer ...

... Kremer, G., Alvarez Quiceno, J.C., Lisi, S., Pierron, T., Gonzalez, C., Sicot, M., Kierren, B., Malterre, D., Rault, J., Le Fevre, P., Bertran, F., Dappe, Y.J., Coraux, J., Pochet, P., Fagot-Revurat, Y. "Electronic Band Structure of Ultimately Thin ...

... Henck, H., Pierucci, D., Zribi, J., Bisti, F., Papalazarou, E., Girard, J.C., Chaste, J., Bertran, F., Le Fèvre, P., Sirotti, F., Perfetti, L., Giorgetti, C., Shukla, A., Rault, J.E., Ouerghi, A. "Evidence of direct electronic band gap in two-dimensional ...

... Céolin, D., Liu, J.C., Vaz da Cruz, V., Ågren, H., Journel, L., Guillemin, R., Marchenko, T., Kushawaha, R.K., Piancastelli, M.N., Püttner, R., Simon, M., Gel’mukhanov, F. "Recoil-induced ultrafast molecular rotation probed by dynamical rotational Doppler ...

... Ilakovac, V., Louat, A., Nicolaou, A., Rueff, J.P., Joly, Y., Brouet, V. "Oxygen states in La- and Rh-doped Sr2IrO4 probed by angle-resolved photoemission and O K-edge resonant inelastic x-ray scattering" Physical Review B., 99(3): art.n° 035149. (2019). ...