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Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging
Publié le 10/11/2016
... Vila-Comamala, J., Diaz, A., Guizar-Sicairos, M., Mantion, A., Kewish, C.M., Menzel, A., Bunk, O., David, C. "Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging" Optics Express., 19(22): 21333-21344 ...
Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging
Publié le 10/11/2016
... Vila-Comamala, J., Diaz, A., Guizar-Sicairos, M., Gorelick, S., Guzenko, V.A., Karvinen, P., Kewish, C.M., Färm, E., Ritala, M., Mantion, A., Bunk, O., Menzel, A., David, C., Christian Morawe, Ali M. Khounsary, Shunji Goto "Characterization of a 20-nm ...
The Scanning Nanoprobe Beamline Nanoscopium at Synchrotron Soleil
Publié le 10/11/2016
... Somogyi, A., Kewish, C.M., Polack, F., Moreno, T., AIP Conference Proceedings "The Scanning Nanoprobe Beamline Nanoscopium at Synchrotron Soleil" Paper presented at the The 10th International Conference on X-ray Microscopy, 15-20/08/2010, Chicago (US). ...
X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001)
Publié le 10/11/2016
... Pancotti, A., Wang, J., Chen, P., Tortech, L., Teodorescu, C.M., Frantzeskakis, E., Barrett, N. "X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO3(001)" Physical Review B., 87(18): art.n° 184116. (2013). ...
High-resolution angle-resolved photoemission spectroscopy study of monolayer and bilayer graphene on the C-face of SiC
Publié le 10/11/2016
... Moreau, E., Godey, S., Wallart, X., Razado-Colambo, I., Avila, J., Asensio, M.C., Vignaud, D. "High-resolution angle-resolved photoemission spectroscopy study of monolayer and bilayer graphene on the C-face of SiC" Physical Review B., 88(7): art.n° ...
High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates
Publié le 10/11/2016
... Mohacsi, I., Karvinen, P., Vartiainen, I., Diaz, A., Somogyi, A., Kewish, C.M., Mercere, P., David, C., Barry Lai "High efficiency x-ray nanofocusing by the blazed stacking of binary zone plates" Paper presented at the X-Ray Nanoimaging: Instruments and ...
Development of fast, simultaneous and multi-technique scanning hard X-ray microscopy at Synchrotron Soleil
Publié le 10/11/2016
... Medjoubi, K., Leclercq, N., Langlois, F., Buteau, A., Lé, S., Poirier, S., Mercère, P., Sforna, M.C., Kewish, C.M., Somogyi, A. "Development of fast, simultaneous and multi-technique scanning hard X-ray microscopy at Synchrotron Soleil" Journal of ...
Development of fast parallel multi-technique scanning X-ray imaging at Synchrotron Soleil
Publié le 10/11/2016
... Medjoubi, K., Leclercq, N., Langlois, F., Buteau, A., Lé, S., Poirier, S., Mercere, P., Kewish, C.M., Somogyi, A. "Development of fast parallel multi-technique scanning X-ray imaging at Synchrotron Soleil" Journal of Physics Conferences Series., 463: art ...
Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography
Publié le 10/11/2016
... Medjoubi, K., Bonissent, A., Leclercq, N., Langlois, F., Mercere, P., Somogyi, A., Barry Lai "Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography" Paper presented at the X-Ray Nanoimaging: Instruments and Methods, San ...
Sampling function of single-X-ray-photon counting hybrid pixel detectors: combining an analytical approach to Monte-Carlo simulations and Finite-Element-Modeling
Publié le 10/11/2016
... Mc Grath, J., Marchal, J., Medjoubi, K. "Sampling function of single-X-ray-photon counting hybrid pixel detectors: combining an analytical approach to Monte-Carlo simulations and Finite-Element-Modeling" Journal of Instrumentation., 8: art.n° P10008. ...