RECHERCHER

... Chen, C., Avila, A., Frantzeskakis, E., Levy, A., Asensio, M.C. "Observation of a two-dimensional liquid of Fröhlich polarons at the bare SrTiO3 surface" Nature Communications., 6: art.n° 8585. (2015). ...

... Mercère, P. "Métrologie à SOLEIL : optique en rayons X" Photoniques., 72: 39-41. (2014). ...

... Lippert, G., Dabrowski, J., Schroeder, T., Schubert, M.A., Yamamoto, Y., Herziger, F., Maultzsch, J., Baringhaus, J., Tegenkamp, C., Asensio, M.C., Avila, J., Lupina, G. "Graphene Grown on Ge(001) from Atomic Source" Carbon., 75: 104-112. (2014). ...

... Johansson, L.I., Armiento, R., Avila, J., Xia, C., Lorcy, S., Abrikosov, I.A., Asensio, M.C., Virojanadara, C. "Multiple p-bands and Bernal stacking of multilayer graphene on C-face SiC, revealed by nano-Angle Resolved Photoemission" Scientific Reports., ...

... Emprin, B., Troussel, P., Soullié, G., Stemmler, P., Mercère, P., Meltchakov, E., Jérôme, A., Delmotte, F. "Characterization of subnanometric layers by grazing incidence X-ray reflectometry" Thin Solid Films., 556: 54–60. (2014). ...

... Emprin, B., Troussel, P., Soullie, G., Stemmler, P., Mercere, P., Meltchakov, E., Jerome, A., Delmotte, F. "X-ray broadband Ni/SiC multilayers: improvement with W barrier layers" Optics Express., 22(21): 25853-25865. (2014). ...

... Desjardins, K., Bordessoule, M., Petrache, C., Menneglier, C., Dallé, D., Mercere, P., Medjoubi, K. "MTF, NPS and DQE characterization of an in-house developed X-ray imaging detector for synchrotron based micro-tomography" Journal of Instrumentation., 9: ...

... Avila, J., Razado-Colambo, I., Lorcy, S., Lagarde, B., Giorgetta, J.L., Polack, F., Asensio, M.C. "ANTARES, a scanning photoemission microscopy beamline at SOLEIL" Journal of Physics Conferences Series., 425: art.n° 192023. (2013). ...

... Avila, J., Razado-Colambo, I., Lorcy, S., Giorgetta, J.L., Polack, F., Asensio, M.C. "Interferometer-controlled soft X-ray scanning photoemission microscope at SOLEIL" Journal of Physics Conferences Series., 425: art.n° 132013. (2013). ...

... Avila, J., Razado-Colambo, I., Lorcy, S., Fleurier, R., Pichonat, E., Vignaud, D., Wallart, X., Asensio, M.C. "Exploring electronic structure of one-atom thick polycrystalline graphene films: A nano angle resolved photoemission study" Scientific Reports., ...