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... Zuber, C., Bazzoli, S., Brunel, P., Burillo, M., Fronty, J.P., Gontier, D., Goulmy, C., Moreau, I., Oudot, G., Rubbelynck, C., Soullié, G., Stemmler, P., Trosseille, C. "Performance of Laser Megajoule’s x-ray streak camera" Review of Scientific ...

... Trosseille, C., Aubert, D., Auger, L., Bazzoli, S., Beck, T., Brunel, P., Burillo, M., Chollet, C., Gazave, J., Jasmin, S., Maruenda, P., Moreau, I., Oudot, G., Raimbourg, J., Soullié, G., Stemmler, P., Zuber, C. "Overview of the ARGOS X-ray framing ...

... Thomas, A.G., Jackman, M.J., Wagstaffe, M., Radtke, H., Syres, K.L., Adell, J., Lévy, A., Martsinovich, N. "Adsorption Studies of p-Aminobenzoic Acid on the Anatase TiO2(101) Surface" Langmuir., 30(41): 12306–12314. (2014). ...

... Sampaio, J.M., Madeira, T.I., Marques, J.P., Parente, F., Costa, A.M., Indelicato, P., Santos, J.P., Lépy, M.C., Ménesguen, Y. "Approaches for theoretical and experimental determinations of K -shell decay rates and fluorescence yields in Ge" Physical ...

... Polack, F. "Un réseau à revêtement multicouche alterné présentant des efficacités de diffraction élevées pour les rayons X tendres" Photoniques., 72: 34-35. (2014). ...

... Mohacsi, I., Karvinen, P., Vartiainen, I., Guzenko, V.A., Somogyi, A., Kewish, C.M., Mercere, P., David, C. "High-efficiency zone-plate optics for multi-keV X-ray focusing" Journal of Synchrotron Radiation., 21(3): 497-501. (2014). ...

... Idir, M., Dovillaire, G., Mercere, P. "Ex- and In-situ Metrology Based on the Shack-Hartmann Technique for Sub-nanometric Metrology" Synchrotron Radiation News., 26(5): 23-29. (2013). ...

... Habinshuti, J., Capiod, P., Nguyen, T.H., Justo, Y., Avila, J., Asensio, M.C., Bournel, F., Gallet, J.J., Vobornik, I., Fujii, J., Addad, A., Lambert, K., Nys, J.P., Lambert, Y., Hens, Z., Osherov, A., Golan, Y., Robbe, O., Turrell, S., Grandidier, B. ...

... Emprin, B., Troussel, P., Villette, B., Delmotte, F., Proceedings of SPIE "Spectral filtering optimization of a measuring channel of an X-ray broadband spectrometer" Paper presented at the Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: ...