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... Huart, L., Nicolas, C., Hervé du Penhoat, M.A., Guigner, J.M., Gosse, C., Palaudoux, J., Lefrançois, S., Mercere, P., Dasilva, P., Renault, J.P., Chevallard, C. "A microfluidic dosimetry cell to irradiate solutions with poorly penetrating radiations: a ...

... Hallot, M., Caja-Munoz, B., Leviel, C., Lebedev, O.I., Retoux, R., Avila, J., Roussel, P., Asensio, M.C., Lethien, C. "Atomic Layer Deposition of a Nanometer-Thick Li3PO4 Protective Layer on LiNi0.5Mn1.5O4 Films: Dream or Reality for Long-Term Cycling?" ...

... Ménesguen, Y., Lépy, M.C. "Metrology of thin layer deposition with combined XRR-GIXRF analysis at SOLEIL". Proceedings of SPIE., 11611: art.n° 116110I. (2021). ...

... Stansbury, C., Utama, I., Fatuzzo, C., Jozwiak, C., Bostwick, A., José Avila, J., Rotenberg, E., Wang, F., Lanzara, A. "Studying Transition Metal Dichalcogenide Superlattices with nano-ARPES". Bulletin of the American Physical Society., 65(1): art.n° M65 ...

... Hlevyack, J., Najafzadeh, S., Lin, M.K., Hashimoto, T., Tsuzuki, A., Nagashima, T., Zhang, W., Fukushima, A., Bai, Y., Chen, P., Liu, R.Y., Li, Y., Floetotto, D., Avila, J., Eckstein, J., Okazaki, K., Shin, S., Chiang, T.C. "Clarifying superconducting ...

... Nakaye, Y., Sakumura, T., Sakuma, Y., Mikusu, S., Dawiec, A., Orsini, F., Grybos, P., Szczygiel, R., Maj, P., Ferrara, J.D., Taguchi, T. "Characterization and performance evaluation of the XSPA‐500k detector using synchrotron radiation" Journal of ...

... de La Rochefoucauld, O., Dovillaire, G., Harms, F., Idir, M., Huang, L., Levecq, X., Piponnier, M., Zeitoun, P. "EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging" Sensors., 21(3): art.n° 874. (2021). ...

... Ernandes, C., Khalil, L., Almabrouk, H., Pierucci, D., Zheng, B., Avila, J., Dudin, P., Chaste, J., Oehler, F., Pala, M., Bisti, F., Brulé, T., Lhuillier, E., Pan, A., Ouerghi, A. "Indirect to direct band gap crossover in two-dimensional WS2(1−x)Se2x ...

... Beckhoff, B. "SI traceable characterisation of nanomaterials by X-ray spectrometry" IOP Conf. Series: Materials Science and Engineering., 891: art.n° 012003. (2020). ...

... Sinha, M., Gupta, R.K., Da Silva, P., Mercere, P., Modi, M.H. "Modification of optical properties of magnesium oxide (MgO) thin film under the influence of ambienceModification of optical properties of magnesium oxide (MgO) thin film under the influence ...