RECHERCHER

... Martin, R.R., Schotyk, W.S., Naftel, S.J., Ablett, J.M., Northrup, P. "Speciation of antimony in polyethylene terephthalate bottles" X-ray Spectrometry., 39(4): 257–259. (2010). ...

... Lupi, S., Baldassarre, L., Mansart, B., Perucchi, A., Barinov, A., Dudin, P., Papalazarou, E., Rodolakis, F., Rueff, J.P., Itié, J.P., Ravy, S., Nicoletti, D., Postorino, P., Hansmann, P., Parragh, N., Toschi, A., Saha-Dasgupta, T., Andersen, O. K., ...

... Heathman, S., Rueff, J.P., Simonelli, L., Denecke, M.A., Griveau, J.C., Caciuffo, R., Lander, G.H. "Resonant x-ray emission spectroscopy at the L3 edge of americium up to 23 GPa" Physical Review B., 82(20): art.n° 201103. (2010). ...

... Gougoussis, C., Rueff, J.P., Calandra, M., d’Astuto, M., Jarrige, I, Ishii, H., Shukla, A., Yamada, I., Azuma, M., Takano, M. "Multiple pre-edge structures in Cu K-edge x-ray absorption spectra of high-Tc cuprates revealed by high-resolution x-ray ...

... Beauchemin, S., Fiset, J.F., Poirier, G., Ablett, J.M. "Arsenic in an Alkaline AMD Treatment Sludge: Characterization and Stability Under Prolonged Anoxic Conditions" Applied Geochemistry., 25(10): 1487-1499. (2010). ...

... Ablett, J.M., Woicik, J.C., Tokei, Z., List, S., Dimasi, E. "Phase identification of self-forming Cu–Mn based diffusion barriers on p-SiOC:H and SiO2 dielectrics using x-ray absorption fine structure" Applied Physics Letters., 94(4): art.n° 042112. (2009 ...

... Valbuena, M.A., Avila, J., Vyalikh, D.V., Guyot, H., Laubschat, C., Molodtsov, S.L., Asensio, M.C. "Electronic band structure and charge density wave transition in quasi-2D KMo6O17 purple bronze" Journal of Physics Conferences Series., 100: art.n° 072021 ...

... Rueff, J.P., Mezouar, M., Acet, M. "Short-range magnetic collapse of Fe under high pressure at high temperatures observed using x-ray emission spectroscopy" Physical Review B., 78(10): art.n° 100405. (2008). ...

... Jarrige, I, Rueff, J.P., Shieh, S. R., Taguchi, M., Ohishi, Y., Matsumura, T., Wang, C.P., Ishii, H., Hiraoka, N., Cai, Y.Q. "Pressure-Induced Valence Anomaly in TmTe Probed by Resonant Inelastic X-Ray Scattering" Physical Review Letters., 101(12): art.n ...

... Hague, C.F., Mariot, J.-M., Ilakovac, V., Delaunay, R., Marsi, M., Sacchi, M., Rueff, J.P., Felsch, W. "Charge transfer at the metal-insulator transition in V2O3 thin films by resonant inelastic x-ray scattering" Physical Review B., 77(4): art.n° 045132. ...