RECHERCHER

... Gueriau, P., Mocuta, C., Dutheil, D.B., Cohen, S.X., Thiaudière, D., Charbonnier, S., Clément, G., Bertrand, L. "Trace Elemental Imaging of Rare Earth Elements Discriminates Tissues at Microscale in Flat Fossils" PLoS One., 9(1): art.n° e86946. (2014). ...

... Gervais, C., Languille, M.A., Reguer, S., Garnier, C., Gillet, M. "Light and anoxia fading of Prussian blue dyed textiles" Heritage Science., 2: art.n° 26. (2014). ...

... Geandier, G., Faurie, D., Renault, P.O., Thiaudière, D., Le Bourhis, E. "In situ monitoring of X-ray strain pole figures of a biaxially deformed ultra-thin film on a flexible substrate" Journal of Applied Crystallography., 47(1): 181-187. (2014). ...

... Faurie, D., Renault, P.O., Le Bourhis, E., Geandier, G., Goudeau, P., Thiaudiere, D. "Mastering the biaxial stress state in nanometric thin films on flexible substrates" Applied Surface Science., 306: 70–74. (2014). ...

... Djaziri, S., Renault, P.O., Le Bourhis, E., Goudeau, P., Faurie, D., Geandier, G., Mocuta, C., Thiaudiere, D. "Comparative study of the mechanical properties of nanostructured thin films on stretchable substrates" Journal of Applied Physics., 116(9): art ...

... Bousige, C., Rols, S., Paineau, E., Rouzière, S., Mocuta, C., Kataura, H., Launois, P. "In situ X-ray diffraction observation of two-step fullerene coalescence in carbon peapods" Europhysics Letters., 103(6): art.n° 66002. (2013). ...

... Beurrot-Borgarino, S., Huneau, B., Verron, E., Rublon, P. "Strain-induced crystallization of carbon black-filled natural rubber during fatigue measured by in situ synchrotron X-ray diffraction" International Journal of Fatigue., 47: 1–7. (2013). ...

... Barata, C., Rocha, F., Andrejkovièová, S., Reguer, S. "Synchrotron SR-XRD analysis of ground micro samples from gilded Portuguese baroque retables" Paper presented at the XV International Clay Conference, 07-11 July 2013 Rio de Janeiro - Brazil. Poster. ...

... Baimpas, N., Le Bourhis, E., Eve, S., Thiaudière, D., Hardie, C., Korsunsky, A.M. "Stress evaluation in thin films: Micro-focus synchrotron X-ray diffraction combined with Focused Ion Beam patterning for do evaluation" Thin Solid Films., 549: 245-250. ...

... Avila, J., Razado-Colambo, I., Lorcy, S., Lagarde, B., Giorgetta, J.L., Polack, F., Asensio, M.C. "ANTARES, a scanning photoemission microscopy beamline at SOLEIL" Journal of Physics Conferences Series., 425: art.n° 192023. (2013). ...