RECHERCHER

... Lafond, A., Choubrac, L., Guillot-Deudon, C., Deniard, P., Jobic, S. "Crystal Structures of Photovoltaic Chalcogenides, an Intricate Puzzle to Solve: the Cases of CIGSe and CZTS Materials" Zeitschrift für Anorganische und Allgemeine Chemie., 638(15): ...

... Korsunsky, A.M., Hofmann, F., Abbey, B., Song, X., Belnoue, J.P., Mocuta, C., Dolbnya, I. "Analysis of the internal structure and lattice (mis)orientation in individual grains of deformed nickel polycrystals by synchrotron X-ray micro-diffraction and ...

... Itié, J.P., Baudelet, F., Briois, V., Elkaim, E., Nadji, A., Thiaudiere, D., Philippe Goudeau, René Guinebretière "Synchrotron Radiation: Instrumentation in Condensed Matter" In X-Rays and Materials: 1-47: Wiley, 2012. ISBN: 9781848213425 ...

... Hild, F., Roux, S. "Comparison of Local and Global Approaches to Digital Image Correlation" Experimental Mechanics., 52(9): 1503-1519. (2012). ...

... Han, S.W., Cha, G.B., Frantzeskakis, E., Razado-Colambo, I., Avila, J., Park, Y.S., Kim, D.H., Hwang, J.H., Kang, J.S., Ryu, S., Yun, W.S., Hong, S.C., Asensio, M.C. "Band-gap expansion in the surface-localized electronic structure of MoS2(0002)" Physical ...

... Gobaut, B., Penuelas, J., Grenet, G., Ferrah, D., Benamrouche, A., Chettaoui, A., Robach, Y., Botella, C., El Kazzi, M., Silly, M.G., Sirotti, F., Saint -Girons, G. "Ge/SrTiO3(001): Correlation between interface chemistry and crystallographic orientation" ...

... Gilliland, S.J., Sans, J.A., Sánchez-Royo, J.F., Almonacid, G., García-Domene, B., Segura, A., Tobias, G., Canadell, E. "Role of p-d and s-d interactions in the electronic structure and band gap of Zn1-xMxO (M=Cr, Mn, Fe, Co, Ni, and Cu): Photoelectron ...

... Frantzeskakis, E., Avila, A., Asensio, M.C. "Chemical imaging and angle-resolved photoemission study of well-ordered thermally reduced SrTiO3(100)" Physical Review B., 85(12): art.n° 125115. (2012). ...

... Fouet, J., Richard, M.I., Mocuta, C., Guichet, C., Thomas, O. "In situ combined synchrotron X-ray diffraction and wafer curvature measurements during formation of thin palladium silicide film on Si(001) and Si (111)" Nuclear Instruments and Methods B., ...

... Faurie, D., Renault, P.O., Geandier, G., Le Bourhis, E. "Time resolved synchrotron x-ray strain measurements of gold thin film on flexible substrate" Thin Solid Films., 520(5): 1603-1607. (2012). ...