RECHERCHER
Résultats de la recherche ""
Development of a Biaxial Tensile Module at Synchrotron Beamline for the Study of Mechanical Properties of Nanostructured Films
Publié le 21/02/2017
... Le Bourhis, E., Girault, B., Renault, P.O., Goudeau, P., Geandier, G., Thiaudière, D., Randriamazaoro, R.N., Chiron, R., Faurie, D., Castelnau, O. "Development of a Biaxial Tensile Module at Synchrotron Beamline for the Study of Mechanical Properties of ...
10 ans de collaboration INRA/SOLEIL
Publié le 26/01/2017
... Cela fait maintenant 10 ans que l’INRA et SOLEIL ont engagé une fructueuse collaboration, qui s’appuie sur la présence d’ingénieurs INRA mis à disposition à SOLEIL. Un ouvrage, paru en janvier 2017, rassemble une trentaine de résultats de ...
Synchrotron X-ray diffraction of bole layers from Portuguese gilded baroque retables
Publié le 10/11/2016
... Barata, C., Rocha, F., Cruz, A.J., Andrejkovičová, S., Reguer, S. "Synchrotron X-ray diffraction of bole layers from Portuguese gilded baroque retables" Applied Clay Science., 116-117: 39–45. (2015). ...
Liquid morphologies and capillary forces between three spherical beads
Publié le 10/11/2016
... Semprebon, C., Scheel, M., Herminghaus, S., Seemann, R., Brinkmann, M. "Liquid morphologies and capillary forces between three spherical beads" Physical Review E., 94(1): art.n° 012907. (2016). ...
Atom-scale depth localization of biologically important chemical elements in molecular layers
Publié le 10/11/2016
... Schneck, E., Scoppola, E., Drnec, J., Mocuta, C., Felici, R., Novikov, A., Fragneto, G., Daillant, J. "Atom-scale depth localization of biologically important chemical elements in molecular layers" PNAS., 113(34): 9521–9526. (2016). ...
Combination of X-ray synchrotron radiation techniques to gather information for clinicians
Publié le 10/11/2016
... Reguer, S., Mocuta, C., Thiaudiere, D., Daudon, M., Bazin, D. "Combination of X-ray synchrotron radiation techniques to gather information for clinicians" Comptes Rendus Chimie., 19(11-12): 1424-1431. (2016). ...
Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage
Publié le 10/11/2016
... Rack, A., Scheel, M., Danilewsky, A.N. "Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage" IUCrJ., 3(2): 108-114. (2016). ...
Experimental X-Ray Ghost Imaging
Publié le 10/11/2016
... Pelliccia, D., Rack, A., Scheel, M., Cantelli, V., Paganin, D.M. "Experimental X-Ray Ghost Imaging" Physical Review Letters., 117(11): art.n° 113902. (2016). ...
Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements
Publié le 10/11/2016
... Ouled-Khachroum, T., Richard, M.I., Noé, P., Guichet, C., Mocuta, C., Sabbione, C., Hippert, F., Thomas, O. "Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and ...
X-ray microscopy of soft and hard human tissues
Publié le 10/11/2016
... Müller, B., Schulz, G., Deyhle, H., Stalder, A.K., Ilgenstein, B., Holme, M.N., Weitkamp, T., Beckmann, F., Hieber, S.E. "X-ray microscopy of soft and hard human tissues" AIP Conference Proceedings., 1696: art.n° 020010. (2016). ...