RECHERCHER

... Chang, Y.W., Cheng, Y., Helfen, L., Xu, F., Tian, T., Scheel, M., Di Michiel, M., Chen, C., Tu, K.N., Baumbach, T. "Electromigration Mechanism of Failure in Flip-Chip Solder Joints Based on Discrete Void Formation" Scientific Reports., 7: art.n° 17950. ...

... Kergourlay, F., Reguer, S., Neff, D., Foy, E., Picca, F., Saheb, M., Hustache, S., Mirambet, F., Dillmann, P. "Stabilization treatment of cultural heritage artefacts: In situ monitoring of marine iron objects dechlorinated in alkali solution" Corrosion ...

... Boyer, M., Yang, X., Fernández Carrión, A.J., Wang, Q., Véron, E., Genevois, C., Hennet, L., Matzen, G., Suard, E., Thiaudière, D., Castro, C., Pelloquin, D., Kong, L.B., Kuang, X., Allix, M. "First transparent oxide ion conducting ceramics synthesized by ...

... Mocuta, C., Stanescu, S., Gallard, M., Barbier, A., Dawiec, A., Kedjar, B., Leclercq, N., Thiaudiere, D. "Fast X-ray reflectivity measurements using an X-ray pixel area detector at the DiffAbs beamline, Synchrotron SOLEIL" Journal of Synchrotron Radiation ...

... Mocuta, C., Bonamy, D., Stanescu, S., El Moussaoui, S., Barbier, A., Montaigne, F., Maccherozzi, F., Bauer, E., Belkhou, R. "Finite size effect on the structural and magnetic properties of MnAs/GaAs(001) patterned microstructures thin films" Scientific ...

... Guerain, M., Grosseau-Poussard, J.L., Geandier, G., Panicaud, B., Tamura, N., Kunz, M., Dejoie, C., Micha, J.S., Thiaudière, D., Goudeau, J.P. "Residual stress determination in oxide layers at different length scales combining Raman spectroscopy and X-ray ...

... Cornelius, T.W., Mocuta, C., Escoubas, S., Merabet, A., Texier, M., Lima, E.C., Araujo, E.B., Kholkin, A.L., Thomas, O. "Piezoelectric response and electrical properties of Pb(Zr1-xTix)O3 thin films: The role of imprint and composition" Journal of Applied ...

... van Stiphout, K., Geenen, F.A., De Schutter, B., Santos, N.M., Miranda, S.M.C., Joly, V., Detavernier, C., Pereira, L.M.C., Temst, K., Vantomme, A. "Formation of ultrathin Ni germanides: solid-phase reaction, morphology and texture" Journal of Physics D : ...

... Többens, D.M., Schorr, S. "The use of anomalous X-ray diffraction as a tool for the analysis of compound semiconductors" Semiconductor Science and Technology., 32(13): art.n° 103002. (2017). ...

... Rack, A., Olbinado, M., Scheel, M., Jodar, B., Morse, J. "Real-Time Hard X-ray Imaging" In The Micro-World Observed by Ultra High-Speed Cameras: 227-237: Springer, 2018. ISBN: 978-3-319-61490-8 ...