PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Mercère, P., Bucourt, S., Cauchon, G., Douillet, D., Dovillaire, G., Goldberg, K.A., Idir, M., Levecq, X., Moreno, T., Naulleau, P.P., Rekawa, S., Zeitoun, P., Assoufid L., Takacs P.Z., Taylor J.S. "X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing" Paper presented at the SPIE's 50th Annual Meeting, X-Ray Systems and Technologies : Advances in Metrology for X-Ray and EUV Optics. Assoufid L., Takacs P.Z., Taylor J.S., 5921: 63-72. (2005).