PUBLICATIONS

Drissi, M., Loison, J.C., Gans, B., Boyé-Péronne, S., Le, H.L., Jiang, M., Nahon, L., Garcia, G.A. "VUV threshold photoelectron spectroscopy of SiS" PCCP - Physical Chemistry Chemical Physics., 27(16): 8121-8126. (2025).