PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Baudot, S., Leroux, C., Chave, F., Boujamaa, R., Martinez, E., Caubet, P., Silly, M.G., Sirotti, F., Reimbold, G., Ghibaudo, G. "Understanding reversal effects of metallic aluminum introduced in HfSiON/TiN PMOSFETs" Microelectronic Engineering., 88(7): 1305-1308. (2011).