PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Verma, H., Le Guen, K., Delaunay, R., Ismail, I., Ilakovac, V., Rueff, J.P., Zheng, Y.J., Jonnard, P. "Study of buried interfaces in Fe/Si multilayer by hard x-ray emission spectroscopy" Surface and Interface Analysis., 53(12): 1043-1047. (2021).