PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Tholapi, R., Gallard, M., Burle, N., Guichet, C., Escoubas, S., Putero, M., Mocuta, C., Richard, M.I., Chahine, R., Sabbione, C., Bernard, M., Fellouh, L., Noé, P., Thomas, O. "Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling" Nanomaterials., 10(6): art.n° 1247. (2020).