PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Marchiori, C., El Kazzi, M., Czornomaz, L., Pierucci, D., Silly, M.G., Sirotti, F., Abel, S., Uccelli, E., Sousa, M., Fompeyrine, J., S. Kar, M. Houssa, S. Van Elshocht, D. Misra, K. Kita, D. Landheer, H. Jagannathan "Physical and Electrical Properties of Scaled Gate Stacks on Si/Passivated In0.53Ga0.47As" Paper presented at the 224th ECS Meeting, Semiconductors, Dielectrics, and Metals for Nanoelectronics 11, San Francisco (US), October 27, 2013 - November 1, 2013.. S. Kar, M. Houssa, S. Van Elshocht, D. Misra, K. Kita, D. Landheer, H. Jagannathan, 58: 369-378. (2013).