PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Cavallo, M., Mastrippolito, D., Bossavit, E., Gureghian, C., Colle, A., Gemo, T., Khalili, A., Zhang, H., Prado, Y., Dandeu, E., Ithurria, S., Dudin, P., Avila, J., Pierucci, D., Lhuillier, E. "Operando observation of gate defects in quantum dot-based field effect transistors" Nanoscale., 17(21): 13410-13418. (2025).