PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Vogt, U., Köhler, D., Dickmann, J., Rahomäki, J., Parfeniukas, K., Kubsky, S., Alves, F., Langlois, F., Engblom, C., Stankevič, T. "Moiré method for nanometer instability investigation of scanning hard x-ray microscopes" Optics Express., 25(11): 12188-12194. (2017).