PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Thomasset, M., Brochet, S., Idir, M., Moreno, T., Polack, F., Carré, J.F., AIP "Metrology results on multielectrod bimorph mirrors" Paper presented at the Third International Workshop on Metrology for X-ray Optics- SRI 2006. AIP, Abstract n° 34050015. (2006).