PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Sheung, J., Qian, J., Sullivan, J., Thomasset, M., Manton, J., Bean, S., Takacs, P.Z., Dvorak, J., Assoufid, L. "Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler" Proceedings of SPIE., 10385: art.n° 1038508. (2017).