PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Stankevič, T., Engblom,C., Langlois, F., Alves, F., Lestrade,A., Jobert, N., Cauchon, G., Vogt, U., Kubsky, S. "Interferometric characterization of rotation stages for X-ray nanotomography" Review of Scientific Instruments., 88(5): art.n° 053703. (2017).