PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Armand, P., Escalier, R., Lizion, J., Mocuta, C., Silly, G., Piarristeguy, A. "In situ study of the crystallization in GeTe0.26 Se0.74 thick film by synchrotron X-ray diffraction" Journal of Alloys and compounds., 953: art.n° 170034. (2023).