PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Ben Yahia, B., Amara, M.S., Gallard, M., Burle, N., Escoubas, S., Guichet, C., Putero, M., Mocuta, C., Richard, M.I., Chahine, R., Sabbione, C., Bernard, M., Fellouh, L., Noé, P., Thomas, O. "In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization" Micro and Nano Engineering., 1: 63-67. (2018).