PUBLICATIONS

Mercère, P., Idir, M., Floriot, J., Levecq, X. "Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology" In Modern Developments in X-Ray and Neutron Optics: 219-232: Springer-Verlag, 2008. ISBN: 978-3-540-74560-0