PUBLICATIONS

Dernière mise à jour : 09/03/2026
  • Barrett, N., Rault, J.E., Wang, J.L., Mathieu, C., Locatelli, A., Mentes, T.O., Niño, M.A., Fusil, S., Bibes, M., Barthélémy, A., Sando, D., Ren, W., Prosandeev, S., Bellaiche, L., B. Vilquin, B., Petraru, A., Krug, I.P., Schneider, C.M. "Full field electron spectromicroscopy applied to ferroelectric materials" Journal of Applied Physics., 113(18): art.n° 187217. (2013).